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Description
  • Radiation damage is a widely studied topic for its effects on detectors and supporting electronics in various practical applications. Radiation hardness and stability of the detector properties are critical parameters in applications of semiconductor radiation detectors. The 0.25 mu m CMOS technology used in fabrication of the Medipix2 and Timepix chips provides high degree of inherent radiation hardness. We present the study of operational, detection and signal processing properties of the irradiated Timepix chip exposed to a high-flux Co-60 source reaching the operational limits of the chip.
  • Radiation damage is a widely studied topic for its effects on detectors and supporting electronics in various practical applications. Radiation hardness and stability of the detector properties are critical parameters in applications of semiconductor radiation detectors. The 0.25 mu m CMOS technology used in fabrication of the Medipix2 and Timepix chips provides high degree of inherent radiation hardness. We present the study of operational, detection and signal processing properties of the irradiated Timepix chip exposed to a high-flux Co-60 source reaching the operational limits of the chip. (en)
Title
  • Evaluation of the Timepix chip radiation hardness using a Co-60 source
  • Evaluation of the Timepix chip radiation hardness using a Co-60 source (en)
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  • Evaluation of the Timepix chip radiation hardness using a Co-60 source
  • Evaluation of the Timepix chip radiation hardness using a Co-60 source (en)
skos:notation
  • RIV/68407700:21340/13:00212859!RIV14-TA0-21340___
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  • P(TE01020069)
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  • Dec
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  • 73705
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  • RIV/68407700:21340/13:00212859
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  • Radiation hardness; Medipix; Pixel detector (en)
http://linked.open.../riv/klicoveSlovo
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  • NL - Nizozemsko
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  • [4CB3BAB2780D]
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  • Nuclear Instruments and Methods in Physics Research, Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
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  • 732
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  • Marčišovský, Michal
  • Hejtmánek, Martin
  • Konček, Ondřej
  • Dučevová, Kateřina
  • Čarná, Mária
http://linked.open...ain/vavai/riv/wos
  • 000327490400112
issn
  • 0168-9002
number of pages
http://bibframe.org/vocab/doi
  • 10.1016/j.nima.2013.06.088
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  • 21340
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