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  • Circuits which are designed to be dependable are evaluated after gate-level design. To demonstrate the influence of implementation technology on dependability parameters, we developed a simple method which transforms the evaluation problem into conceptual hardware and then to SAT instances. The method can accommodate any combinational fault model. The performed evaluation demonstrated that the dependability parameters of the implementations correlate to a significant degree.
  • Circuits which are designed to be dependable are evaluated after gate-level design. To demonstrate the influence of implementation technology on dependability parameters, we developed a simple method which transforms the evaluation problem into conceptual hardware and then to SAT instances. The method can accommodate any combinational fault model. The performed evaluation demonstrated that the dependability parameters of the implementations correlate to a significant degree. (en)
Title
  • The Influence of Implementation Technology on Dependability Parameters
  • The Influence of Implementation Technology on Dependability Parameters (en)
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  • The Influence of Implementation Technology on Dependability Parameters
  • The Influence of Implementation Technology on Dependability Parameters (en)
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  • RIV/68407700:21240/12:00195702!RIV13-MSM-21240___
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  • I
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  • 141448
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  • RIV/68407700:21240/12:00195702
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  • dependability; SAT; fault classification; generalized miter (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [86D51E30D8BE]
http://linked.open...v/mistoKonaniAkce
  • Cesme, Izmir
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  • Los Alamitos
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  • Proceedings of the 15th Euromicro Conference on Digital System Design
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  • Balcárek, Jiří
  • Fišer, Petr
  • Schmidt, Jan
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http://linked.open.../riv/zahajeniAkce
number of pages
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  • IEEE Computer Society Press
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  • 978-0-7695-4798-5
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  • 21240
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