About: Test Pattern Compression Based on Pattern Overlapping and Broadcasting

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
rdfs:seeAlso	http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5952372&isnumber=5952357
Description	The high test data volume and long test application time are two major concerns for testing scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction. This paper presents a new test compression and test application approach that combines both the test pattern overlapping technique and the test pattern broadcasting technique. This paper will illustrate that these new techniques are effective in both the test application time and the test data volume reduction. The high test data volume and long test application time are two major concerns for testing scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction. This paper presents a new test compression and test application approach that combines both the test pattern overlapping technique and the test pattern broadcasting technique. This paper will illustrate that these new techniques are effective in both the test application time and the test data volume reduction. (en)
Title	Test Pattern Compression Based on Pattern Overlapping and Broadcasting Test Pattern Compression Based on Pattern Overlapping and Broadcasting (en)
skos:prefLabel	Test Pattern Compression Based on Pattern Overlapping and Broadcasting Test Pattern Compression Based on Pattern Overlapping and Broadcasting (en)
skos:notation	RIV/68407700:21240/11:00184355!RIV12-MSM-21240___
http://linked.open...avai/predkladatel	Fakulta informačních technologií
http://linked.open...avai/riv/aktivita	P S Z
http://linked.open...avai/riv/aktivity	P(GA102/09/1668), S, Z(MSM6840770014)
http://linked.open...vai/riv/dodaniDat	2012
http://linked.open...aciTvurceVysledku	Chloupek, Martin Novák, Ondřej
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	České vysoké učení technické v Praze / Fakulta informačních technologií
http://linked.open...dnocenehoVysledku	234868
http://linked.open...ai/riv/idVysledku	RIV/68407700:21240/11:00184355
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Scan-based design; test compression; broadcasting; overlapping; test cost (en)
http://linked.open.../riv/klicoveSlovo	Scan-based design test compression broadcasting test cost overlapping
http://linked.open...ontrolniKodProRIV	[7A3A1E8F4BA6]
http://linked.open...v/mistoKonaniAkce	Liberec
http://linked.open...i/riv/mistoVydani	New York
http://linked.open...i/riv/nazevZdroje	2011 10th International workshop on Electronics, Control, Measurement and Signals (ECMS)
http://linked.open...in/vavai/riv/obor	JC
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	SoC circuits reliability and availability improvement
http://linked.open...UplatneniVysledku	2011
http://linked.open...iv/tvurceVysledku	Chloupek, Martin Novák, Ondřej
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2011-06-01 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Výzkum perspektivních informačních a komunikačních technologií
number of pages	5 (xsd:int)
http://bibframe.org/vocab/doi	10.1109/IWECMS.2011.5952372
http://purl.org/ne...btex#hasPublisher	IEEE Computer Society Press
https://schema.org/isbn	978-1-61284-397-1
http://localhost/t...ganizacniJednotka	21240
is http://linked.open...avai/riv/vysledek of	Test Pattern Compression Based on Pattern Overlapping and Broadcasting Test Pattern Compression Based on Pattern Overlapping and Broadcasting

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