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  • The paper describes construction and applicability of the two dimensional sliding bench. It can be used for precise adjustment in the plane during the lithographical exposure of the substrate. It is applicable for exposure on the gel mask or direct exposure to the final substrate. It was developed mainly for preparing of the simple microelectromechanical structures for the gas sensors (SAW structures, application of active substances for conductivity sensors, micromechanical structures adjustment and trimming). Light exposure is provided via the lens and enlarged pattern for a given wavelength (these optical components are not a part of the bench). The bench allows replication of one structure over a larger area of the mask (substrate) and automated intensity setting and timing. The bench can also be used for direct writing of simple structures into the photo-resist.
  • The paper describes construction and applicability of the two dimensional sliding bench. It can be used for precise adjustment in the plane during the lithographical exposure of the substrate. It is applicable for exposure on the gel mask or direct exposure to the final substrate. It was developed mainly for preparing of the simple microelectromechanical structures for the gas sensors (SAW structures, application of active substances for conductivity sensors, micromechanical structures adjustment and trimming). Light exposure is provided via the lens and enlarged pattern for a given wavelength (these optical components are not a part of the bench). The bench allows replication of one structure over a larger area of the mask (substrate) and automated intensity setting and timing. The bench can also be used for direct writing of simple structures into the photo-resist. (en)
Title
  • 2D sliding bench for lithographic exposure (en)
  • 2D sliding bench for lithographic exposure
skos:prefLabel
  • 2D sliding bench for lithographic exposure (en)
  • 2D sliding bench for lithographic exposure
skos:notation
  • RIV/68407700:21230/14:00222312!RIV15-MV0-21230___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(VG20102015015)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 58159
http://linked.open...ai/riv/idVysledku
  • RIV/68407700:21230/14:00222312
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Test bench; Sensor characterization; Distance measurement; Lithography (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [809BACA877C4]
http://linked.open...v/mistoKonaniAkce
  • Brno
http://linked.open...i/riv/mistoVydani
  • Brno
http://linked.open...i/riv/nazevZdroje
  • Electronic Devices and Systems IMAPS CS International Conference 2014
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Bouřa, Adam
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
http://purl.org/ne...btex#hasPublisher
  • Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií
https://schema.org/isbn
  • 978-80-214-4985-5
http://localhost/t...ganizacniJednotka
  • 21230
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