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  • This research focuses on the possible emergence of tin crystalline formations on thick layers of lead-free solders. For this test were selected two lead-free solders, which are commonly used in the electronics industry, 99Sn1Cu and 96Sn3,8Ag0,2Cu. The created samples were exposed to any mechanical static stress and suitable climatic conditions under the defined climatic conditions. The aim was to verify whether under the conditions that occur in many electrical devices, there is the growth of whiskers.
  • This research focuses on the possible emergence of tin crystalline formations on thick layers of lead-free solders. For this test were selected two lead-free solders, which are commonly used in the electronics industry, 99Sn1Cu and 96Sn3,8Ag0,2Cu. The created samples were exposed to any mechanical static stress and suitable climatic conditions under the defined climatic conditions. The aim was to verify whether under the conditions that occur in many electrical devices, there is the growth of whiskers. (en)
Title
  • The Growth of Whiskers on Thick Layers of Lead-Free Solders
  • The Growth of Whiskers on Thick Layers of Lead-Free Solders (en)
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  • The Growth of Whiskers on Thick Layers of Lead-Free Solders
  • The Growth of Whiskers on Thick Layers of Lead-Free Solders (en)
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  • RIV/68407700:21230/13:00210871!RIV14-MSM-21230___
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  • 76942
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  • RIV/68407700:21230/13:00210871
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  • Whiskers; Lead-Free Solders; Thick Layers (en)
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http://linked.open...ontrolniKodProRIV
  • [5B5C0AE557D8]
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  • Žák, Pavel
  • Konečná, Zuzana
  • Plaček, Martin
  • Marcinka, Ondřej
http://localhost/t...ganizacniJednotka
  • 21230
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