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| rdf:type
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| Description
| - The nonlinear models of MESFETs implemented in the contemporary CAD tools can well serve to perform various both time- and frequency-domain simulations of microwave circuits with pHEMTs, and the s-parameters measured at different bias points provide valuable information needed to extract the parameters of such nonlinear models. Regarding the model accuracy, a comprehensive comparison has been created for the Curtice, Statz, TOM, TOM2, Materka, Ahmed, and Dobes models. However, creating a reliable optimization procedure for the nonlinear model parameters' extraction from the s-parameters is a complicated task. After a lot of tests, we have suggested a robust combination of a meta-heuristics (Simulated Annealing selected) and a direct method (Levenberg-Marquardt one selected). We have checked the algorithm on two practical examples. First, for a development of a low-noise amplifier intended as a common input unit for a GPS/Galileo/GLONASS/Compass receiver, an accurate nonlinear model of ATF-54143 is necessary. Therefore, we have utilized a set of multibias s-parameters, and we have extracted all the parameters for both our Dobes model (which is further used for a multiobjective optimization) and Statz one (which is necessary for standard simulators like Micro-Cap, e.g.). Second, we have extracted model parameters for a 110 GHz GaAs pHEMT with a gate length 0.25 um. The DC characteristics and s-parameters for this pHEMT are shownfor the frequencies from 4 to 90 GHz.
- The nonlinear models of MESFETs implemented in the contemporary CAD tools can well serve to perform various both time- and frequency-domain simulations of microwave circuits with pHEMTs, and the s-parameters measured at different bias points provide valuable information needed to extract the parameters of such nonlinear models. Regarding the model accuracy, a comprehensive comparison has been created for the Curtice, Statz, TOM, TOM2, Materka, Ahmed, and Dobes models. However, creating a reliable optimization procedure for the nonlinear model parameters' extraction from the s-parameters is a complicated task. After a lot of tests, we have suggested a robust combination of a meta-heuristics (Simulated Annealing selected) and a direct method (Levenberg-Marquardt one selected). We have checked the algorithm on two practical examples. First, for a development of a low-noise amplifier intended as a common input unit for a GPS/Galileo/GLONASS/Compass receiver, an accurate nonlinear model of ATF-54143 is necessary. Therefore, we have utilized a set of multibias s-parameters, and we have extracted all the parameters for both our Dobes model (which is further used for a multiobjective optimization) and Statz one (which is necessary for standard simulators like Micro-Cap, e.g.). Second, we have extracted model parameters for a 110 GHz GaAs pHEMT with a gate length 0.25 um. The DC characteristics and s-parameters for this pHEMT are shownfor the frequencies from 4 to 90 GHz. (en)
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| Title
| - A Reliable Algorithm for a pHEMT Nonlinear Model Identification Using a Set of Multibias s-parameters
- A Reliable Algorithm for a pHEMT Nonlinear Model Identification Using a Set of Multibias s-parameters (en)
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| skos:prefLabel
| - A Reliable Algorithm for a pHEMT Nonlinear Model Identification Using a Set of Multibias s-parameters
- A Reliable Algorithm for a pHEMT Nonlinear Model Identification Using a Set of Multibias s-parameters (en)
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| skos:notation
| - RIV/68407700:21230/13:00210703!RIV14-TA0-21230___
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| http://linked.open...avai/predkladatel
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| http://linked.open...avai/riv/aktivita
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| http://linked.open...avai/riv/aktivity
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| http://linked.open...vai/riv/dodaniDat
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| http://linked.open...aciTvurceVysledku
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| http://linked.open.../riv/druhVysledku
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| http://linked.open...iv/duvernostUdaju
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| http://linked.open...titaPredkladatele
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| http://linked.open...dnocenehoVysledku
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| http://linked.open...ai/riv/idVysledku
| - RIV/68407700:21230/13:00210703
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| http://linked.open...riv/jazykVysledku
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| http://linked.open.../riv/klicovaSlova
| - Pseudomorphic HEMT; pHEMT; modeling; model identification; characterization; parameter extraction; s-parameters; multibias measurements; root-mean-square criteria; optimization; metaheuristics; simulated annealing; Levenberg-Marquardt algorithm (en)
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| http://linked.open.../riv/klicoveSlovo
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| http://linked.open...ontrolniKodProRIV
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| http://linked.open...v/mistoKonaniAkce
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| http://linked.open...i/riv/mistoVydani
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| http://linked.open...i/riv/nazevZdroje
| - International Semiconductor Device Research Symposium 2013
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| http://linked.open...in/vavai/riv/obor
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| http://linked.open...ichTvurcuVysledku
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| http://linked.open...cetTvurcuVysledku
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| http://linked.open...vavai/riv/projekt
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| http://linked.open...UplatneniVysledku
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| http://linked.open...iv/tvurceVysledku
| - Dobeš, Josef
- Grábner, Martin
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| http://linked.open...vavai/riv/typAkce
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| http://linked.open.../riv/zahajeniAkce
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| number of pages
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| http://purl.org/ne...btex#hasPublisher
| |
| https://schema.org/isbn
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| http://localhost/t...ganizacniJednotka
| |
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