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  • This article deals with observation of commonly used fluxes aggression on copper surface in electronics assembly during the reflow process. Ten types of fluxes were compared in our experiment. Measurement was carried on glass samples with copper vapor deposition. Determination of flux aggression on copper surface was based on the measurement of absorption of light on spectrophotometer.
  • This article deals with observation of commonly used fluxes aggression on copper surface in electronics assembly during the reflow process. Ten types of fluxes were compared in our experiment. Measurement was carried on glass samples with copper vapor deposition. Determination of flux aggression on copper surface was based on the measurement of absorption of light on spectrophotometer. (en)
Title
  • Comparison of commonly used fluxes aggression on copper surface
  • Comparison of commonly used fluxes aggression on copper surface (en)
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  • Comparison of commonly used fluxes aggression on copper surface
  • Comparison of commonly used fluxes aggression on copper surface (en)
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  • RIV/68407700:21230/12:00199223!RIV13-MSM-21230___
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  • S
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  • 127889
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  • RIV/68407700:21230/12:00199223
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  • flux; reflow process; fluxes aggression; surface mount technology (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [F3F1D9CF3279]
http://linked.open...v/mistoKonaniAkce
  • Bad Aussee
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  • Wien
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  • 35th International Spring Seminar on Electronics Technology
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  • Dušek, Karel
  • Náhlík, Vojtěch
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number of pages
http://bibframe.org/vocab/doi
  • 10.1109/ISSE.2012.6273137
http://purl.org/ne...btex#hasPublisher
  • Technische Universität
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  • 978-1-4673-2241-6
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  • 21230
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