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Description
  • We present our results of the atomic force microscope (AFM) surface analysis of graphene layers prepared by different methods. We compared surfaces of exfoliated graphene, graphene grown CVD on copper foil and graphene prepared by high temperature annealing of SiC. The CVD grown graphene layers were characterized electrically. We measured the sheet resistance of the layers in the presence of gate voltage applied on the bottom electrode realized by the conducting silicon substrate isolated by the silicon oxide layer.
  • We present our results of the atomic force microscope (AFM) surface analysis of graphene layers prepared by different methods. We compared surfaces of exfoliated graphene, graphene grown CVD on copper foil and graphene prepared by high temperature annealing of SiC. The CVD grown graphene layers were characterized electrically. We measured the sheet resistance of the layers in the presence of gate voltage applied on the bottom electrode realized by the conducting silicon substrate isolated by the silicon oxide layer. (en)
Title
  • ELECTRICAL AND AFM STUDY OF DIFFERENT TYPES OF GRAPHENE
  • ELECTRICAL AND AFM STUDY OF DIFFERENT TYPES OF GRAPHENE (en)
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  • ELECTRICAL AND AFM STUDY OF DIFFERENT TYPES OF GRAPHENE
  • ELECTRICAL AND AFM STUDY OF DIFFERENT TYPES OF GRAPHENE (en)
skos:notation
  • RIV/68407700:21230/11:00187518!RIV12-MSM-21230___
http://linked.open...avai/predkladatel
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GAP108/11/0894), S, Z(MSM6840770014)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 196993
http://linked.open...ai/riv/idVysledku
  • RIV/68407700:21230/11:00187518
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • atomic force microscopy; graphene (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [EDFEA801F11F]
http://linked.open...v/mistoKonaniAkce
  • Brno
http://linked.open...i/riv/mistoVydani
  • Ostrava
http://linked.open...i/riv/nazevZdroje
  • NANOCON 2011 Conference Proceedings
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Janoušek, Michal
  • Náhlík, Josef
  • Voves, Jan
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
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  • TANGER, spol.s r.o.
https://schema.org/isbn
  • 978-80-87294-23-9
http://localhost/t...ganizacniJednotka
  • 21230
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