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  • The work is focused on investigation of behavior of thick film resistors. The changes of parameters of thick film samples exposed to accelerated ageing were analyzed. The samples were exposed in three types of environment during relatively long time. The samples with different sizes of thick film resistors were prepared. Conductive and resistive structures were deposited on corundum substrates by screen printing. The silver polymer paste for conductive layer and the carbon black polymer paste for resistive layer were used. The resistance and non linearity of current-voltage characteristic were measured. Non linearity was measured as distortion of sinusoidal AC powering signal.
  • The work is focused on investigation of behavior of thick film resistors. The changes of parameters of thick film samples exposed to accelerated ageing were analyzed. The samples were exposed in three types of environment during relatively long time. The samples with different sizes of thick film resistors were prepared. Conductive and resistive structures were deposited on corundum substrates by screen printing. The silver polymer paste for conductive layer and the carbon black polymer paste for resistive layer were used. The resistance and non linearity of current-voltage characteristic were measured. Non linearity was measured as distortion of sinusoidal AC powering signal. (en)
Title
  • The Influence of Envirnment on Properties of Thick Film Components
  • The Influence of Envirnment on Properties of Thick Film Components (en)
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  • The Influence of Envirnment on Properties of Thick Film Components
  • The Influence of Envirnment on Properties of Thick Film Components (en)
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  • RIV/68407700:21230/10:00171379!RIV11-MSM-21230___
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  • Z(MSM6840770021)
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  • 263630
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  • RIV/68407700:21230/10:00171379
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  • thick film rezistor; non linearity of C-V characteristic (en)
http://linked.open.../riv/klicoveSlovo
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  • [3633C2478511]
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  • Brno
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  • Brno
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  • EDS 2010 Electronic Devices and Systems
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  • Beshajová Pelikánová, Ivana
  • Běhan, Tomáš
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http://linked.open...n/vavai/riv/zamer
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  • Vysoké učení technické v Brně. Fakulta elektrotechniky a informatiky. Ústav mikroelektroniky
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  • 978-80-214-4138-5
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  • 21230
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