About: The Contact Resistance at Interface of Two Different Thick Film Layers     Goto   Sponge   NotDistinct   Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

AttributesValues
rdf:type
Description
  • The work is focused on analysis of interface of two different thick film layers. Contact resistance between conductive a resistive layers was measured and analyzed. Contact resistance is influenced by technology of deposition of layers, by conditions of curing, by materials and surface quality of substrate etc. Three point methods is used for measuring of contact resistance. This parameter was analyzed in dependence on geometry of contact area. Polymer thick film pastes were used for preparation of samples.
  • The work is focused on analysis of interface of two different thick film layers. Contact resistance between conductive a resistive layers was measured and analyzed. Contact resistance is influenced by technology of deposition of layers, by conditions of curing, by materials and surface quality of substrate etc. Three point methods is used for measuring of contact resistance. This parameter was analyzed in dependence on geometry of contact area. Polymer thick film pastes were used for preparation of samples. (en)
Title
  • The Contact Resistance at Interface of Two Different Thick Film Layers
  • The Contact Resistance at Interface of Two Different Thick Film Layers (en)
skos:prefLabel
  • The Contact Resistance at Interface of Two Different Thick Film Layers
  • The Contact Resistance at Interface of Two Different Thick Film Layers (en)
skos:notation
  • RIV/68407700:21230/08:00147332!RIV11-MSM-21230___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • S
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 361117
http://linked.open...ai/riv/idVysledku
  • RIV/68407700:21230/08:00147332
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • contact resistance; thick film layer (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [ABE8E048CB43]
http://linked.open...v/mistoKonaniAkce
  • Budapest
http://linked.open...i/riv/mistoVydani
  • New York
http://linked.open...i/riv/nazevZdroje
  • 31st International Spring Seminar on Electronics Technology
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Beshajová Pelikánová, Ivana
  • Duraj, A.
  • Slovák, F.
http://linked.open...vavai/riv/typAkce
http://linked.open...ain/vavai/riv/wos
  • 000272337900102
http://linked.open.../riv/zahajeniAkce
number of pages
http://purl.org/ne...btex#hasPublisher
  • IEEE
https://schema.org/isbn
  • 978-1-4244-3973-7
http://localhost/t...ganizacniJednotka
  • 21230
is http://linked.open...avai/riv/vysledek of
Faceted Search & Find service v1.16.118 as of Jun 21 2024


Alternative Linked Data Documents: ODE     Content Formats:   [cxml] [csv]     RDF   [text] [turtle] [ld+json] [rdf+json] [rdf+xml]     ODATA   [atom+xml] [odata+json]     Microdata   [microdata+json] [html]    About   
This material is Open Knowledge   W3C Semantic Web Technology [RDF Data] Valid XHTML + RDFa
OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 58 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software