About: A Simple Method for Extreme Impedances Measurement     Goto   Sponge   NotDistinct   Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

AttributesValues
rdf:type
Description
  • The paper describes a new method for measurement of extreme impedances - impedances with a magnitude of the corresponding reflection coefficient approaching unity. The proposed method employs a common vector network analyzer (VNA) with a reference impedance of 50 Ω or 75 Ω. The method is based on subtracting a reference reflection coefficient from a reflection coefficient of the device under test (DUT) by a 180-deg 3dB hybrid coupler. This difference is then amplified and measured by the VNA as a transmission coefficient. The method was experimentally verified in frequency band from 1.5 to 3 GHz. A corresponding calibration and correction method is suggested. Applications of the method can be expected in measurements of emerging novel microwave and THz devices based on carbon nanotubes, whose impedances are in orders of tens or hundreds of kΩ.
  • The paper describes a new method for measurement of extreme impedances - impedances with a magnitude of the corresponding reflection coefficient approaching unity. The proposed method employs a common vector network analyzer (VNA) with a reference impedance of 50 Ω or 75 Ω. The method is based on subtracting a reference reflection coefficient from a reflection coefficient of the device under test (DUT) by a 180-deg 3dB hybrid coupler. This difference is then amplified and measured by the VNA as a transmission coefficient. The method was experimentally verified in frequency band from 1.5 to 3 GHz. A corresponding calibration and correction method is suggested. Applications of the method can be expected in measurements of emerging novel microwave and THz devices based on carbon nanotubes, whose impedances are in orders of tens or hundreds of kΩ. (en)
Title
  • A Simple Method for Extreme Impedances Measurement
  • A Simple Method for Extreme Impedances Measurement (en)
skos:prefLabel
  • A Simple Method for Extreme Impedances Measurement
  • A Simple Method for Extreme Impedances Measurement (en)
skos:notation
  • RIV/68407700:21230/07:00149315!RIV13-MSM-21230___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM6840770015)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 408184
http://linked.open...ai/riv/idVysledku
  • RIV/68407700:21230/07:00149315
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • calibration; impedance measurement; microwave circuits; microwave measurements; nanotechnology (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [AACA92630117]
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Hoffmann, Karel
  • Randus, Martin
http://linked.open...n/vavai/riv/zamer
http://bibframe.org/vocab/doi
  • 10.1109/ARFTG.2008.4804276
http://localhost/t...ganizacniJednotka
  • 21230
Faceted Search & Find service v1.16.118 as of Jun 21 2024


Alternative Linked Data Documents: ODE     Content Formats:   [cxml] [csv]     RDF   [text] [turtle] [ld+json] [rdf+json] [rdf+xml]     ODATA   [atom+xml] [odata+json]     Microdata   [microdata+json] [html]    About   
This material is Open Knowledge   W3C Semantic Web Technology [RDF Data] Valid XHTML + RDFa
OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 58 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software