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rdf:type
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Description
| - The deposition of the coating where done keeping constant the argon pressure at 0.2 Pa and the target current density (JW = 6 mA.cm-2). To cover all composition range for tungsten oxide prepared by CP (i.e. from W100 to W25O75), the oxygen flow 0 - 20 sccm was used. During the RGP process, the oxygen flow was pulsed using a square regulation signal defined by a pulsing period (T) and an oxygen injection time (tON). During tON the oxygen flow was 20 sccm and during tOFF (= T - ton), the oxygen flow was 0 sccm. The chemical composition were analysed by electron probe microanalysis (EPMA), the chemical profile by glow discharge optical emission spectroscopy (GDOES), the morphology were analysed by scanning electron microscope (SEM) and the colour represented by the CieL*a*b* system was measured by colorimetry.
- The deposition of the coating where done keeping constant the argon pressure at 0.2 Pa and the target current density (JW = 6 mA.cm-2). To cover all composition range for tungsten oxide prepared by CP (i.e. from W100 to W25O75), the oxygen flow 0 - 20 sccm was used. During the RGP process, the oxygen flow was pulsed using a square regulation signal defined by a pulsing period (T) and an oxygen injection time (tON). During tON the oxygen flow was 20 sccm and during tOFF (= T - ton), the oxygen flow was 0 sccm. The chemical composition were analysed by electron probe microanalysis (EPMA), the chemical profile by glow discharge optical emission spectroscopy (GDOES), the morphology were analysed by scanning electron microscope (SEM) and the colour represented by the CieL*a*b* system was measured by colorimetry. (en)
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Title
| - Comparison of W-O Coatings Deposited by DC Reactive Magnetron Sputtering in Continuous and Pulsing Mode
- Comparison of W-O Coatings Deposited by DC Reactive Magnetron Sputtering in Continuous and Pulsing Mode (en)
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skos:prefLabel
| - Comparison of W-O Coatings Deposited by DC Reactive Magnetron Sputtering in Continuous and Pulsing Mode
- Comparison of W-O Coatings Deposited by DC Reactive Magnetron Sputtering in Continuous and Pulsing Mode (en)
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skos:notation
| - RIV/68407700:21230/07:00140088!RIV12-MSM-21230___
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68407700:21230/07:00140088
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - magnetron sputtering; tungsten oxide (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...ontrolniKodProRIV
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
| - Cavaleiro, A.
- Polcar, Tomáš
- Parreira, N. M. G.
- Vaz, F.
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http://linked.open...n/vavai/riv/zamer
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http://localhost/t...ganizacniJednotka
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