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| rdf:type
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| Description
| - Calibration and correction methods for Vector Network Analyzer (VNA) are based on the fundamental assumption of constant error model, which is independent of connected calibration standards and/or devices under test (DUT). Unfortunately, this assumption is not satisfied well for planar calibration standards fabricated by etching technology on soft substrates. An evaluation of the error etching technology on soft substrates. An evaluation of the error model is affected expecially with a variation of the manufacturing process and also with a reproducibillity of an assembly. In this paper, we propose error minimazation using selection of the best combination of available calibration standards based on time-domain reflection (TDR) measuerment. The proposed method was verified experimentally using short, open, load and thru (SOLT) standards fabricated on FR4 laminate substrate getting essential reduction of the measurement error in frequency range up to 15 GHz.
- Calibration and correction methods for Vector Network Analyzer (VNA) are based on the fundamental assumption of constant error model, which is independent of connected calibration standards and/or devices under test (DUT). Unfortunately, this assumption is not satisfied well for planar calibration standards fabricated by etching technology on soft substrates. An evaluation of the error etching technology on soft substrates. An evaluation of the error model is affected expecially with a variation of the manufacturing process and also with a reproducibillity of an assembly. In this paper, we propose error minimazation using selection of the best combination of available calibration standards based on time-domain reflection (TDR) measuerment. The proposed method was verified experimentally using short, open, load and thru (SOLT) standards fabricated on FR4 laminate substrate getting essential reduction of the measurement error in frequency range up to 15 GHz. (en)
- Calibration and correction methods for Vector Network Analyzer (VNA) are based on the fundamental assumption of constant error model, which is independent of connected calibration standards and/or devices under test (DUT). Unfortunately, this assumption is not satisfied well for planar calibration standards fabricated by etching technology on soft substrates. An evaluation of the error etching technology on soft substrates. An evaluation of the error model is affected expecially with a variation of the manufacturing process and also with a reproducibillity of an assembly. In this paper, we propose error minimazation using selection of the best combination of available calibration standards based on time-domain reflection (TDR) measuerment. The proposed method was verified experimentally using short, open, load and thru (SOLT) standards fabricated on FR4 laminate substrate getting essential reduction of the measurement error in frequency range up to 15 GHz. (cs)
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| Title
| - Improved Evaluation of Planar Calibration Standards Using TDR Preselection Method
- Improved Evaluation of Planar Calibration Standards Using TDR Preselection Method (en)
- Vylepšené hodnocení planárních kalibračních standardů pomocí TDR předvýběrové metody (cs)
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| skos:prefLabel
| - Improved Evaluation of Planar Calibration Standards Using TDR Preselection Method
- Improved Evaluation of Planar Calibration Standards Using TDR Preselection Method (en)
- Vylepšené hodnocení planárních kalibračních standardů pomocí TDR předvýběrové metody (cs)
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| skos:notation
| - RIV/68407700:21230/06:03125272!RIV07-MSM-21230___
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| http://linked.open...avai/riv/aktivita
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| http://linked.open...avai/riv/aktivity
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| http://linked.open...vai/riv/dodaniDat
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| http://linked.open...aciTvurceVysledku
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| http://linked.open.../riv/druhVysledku
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| http://linked.open...iv/duvernostUdaju
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| http://linked.open...titaPredkladatele
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| http://linked.open...dnocenehoVysledku
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| http://linked.open...ai/riv/idVysledku
| - RIV/68407700:21230/06:03125272
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| http://linked.open...riv/jazykVysledku
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| http://linked.open.../riv/klicovaSlova
| - calibration standards; equivalent circuits; error correction; scattering parameters; vector network analyzer (en)
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| http://linked.open.../riv/klicoveSlovo
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| http://linked.open...i/riv/kodPristupu
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| http://linked.open...ontrolniKodProRIV
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| http://linked.open...i/riv/mistoVydani
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| http://linked.open...n/vavai/riv/nosic
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| http://linked.open...in/vavai/riv/obor
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| http://linked.open...ichTvurcuVysledku
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| http://linked.open...cetTvurcuVysledku
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| http://linked.open...UplatneniVysledku
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| http://linked.open...iv/tvurceVysledku
| - Hoffmann, Karel
- Škvor, Zbyněk
- Sokol, Vratislav
- Vancl, J.
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| http://linked.open...n/vavai/riv/zamer
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| http://localhost/t...ganizacniJednotka
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