About: Handbook of Electronic Testing

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	To get experienced in such a complex field like electronic circuit testing, it is not enough to know how to work with tools in a manner of pushing buttons as commercial tools are exploited usually. To master the field, the test engineer has to understand how the tools are working, why and when some algorithms are more efficient than others. The Handbook of Electronic Testing provides experiences of the authors' team with testing, test aware design and the methodology of teaching students - future electronic designers. New dedicated tools for hands-on training were developed and they are described in the book and included on the attached CD.Handbook content:Defects, Faults and Fault Models, Test Generation Techniques and Algorithms, Design for Testability, Built-in Self-Test, Analog Test and Diagnostics, IDDQ Testing, Tools for Better Understanding of the Described Problems, Mentor Design for Test Tools, Educational Integrated Circuits. To get experienced in such a complex field like electronic circuit testing, it is not enough to know how to work with tools in a manner of pushing buttons as commercial tools are exploited usually. To master the field, the test engineer has to understand how the tools are working, why and when some algorithms are more efficient than others. The Handbook of Electronic Testing provides experiences of the authors' team with testing, test aware design and the methodology of teaching students - future electronic designers. New dedicated tools for hands-on training were developed and they are described in the book and included on the attached CD.Handbook content:Defects, Faults and Fault Models, Test Generation Techniques and Algorithms, Design for Testability, Built-in Self-Test, Analog Test and Diagnostics, IDDQ Testing, Tools for Better Understanding of the Described Problems, Mentor Design for Test Tools, Educational Integrated Circuits. (en) Kniha se zabývá defekty a poruchami v elektronických systémech, generováním testovacích vzorků,návrhem pro snadnou testovatelnost, vestavěnými diagnostickými prostředky, Iddq testováním, testováním analogových obvodů a systémů, prostředky pro snazší pochopení základních diagnostických metod, prostředky pro výuku diagnostiky, návrhovými prostředky Mentor a specializovaným hardwarem pro výuku diagnostiky. (cs)
Title	Handbook of Electronic Testing Handbook of Electronic Testing (en) Kniha o testování elektronických systémů (cs)
skos:prefLabel	Handbook of Electronic Testing Handbook of Electronic Testing (en) Kniha o testování elektronických systémů (cs)
skos:notation	RIV/68407700:21230/05:03110911!RIV06-GA0-21230___
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(GA102/04/2137)
http://linked.open...vai/riv/dodaniDat	2006
http://linked.open...aciTvurceVysledku	Novák, Ondřej
http://linked.open.../riv/druhVysledku	B - Odborná kniha
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	České vysoké učení technické v Praze / Fakulta elektrotechnická
http://linked.open...dnocenehoVysledku	523034
http://linked.open...ai/riv/idVysledku	RIV/68407700:21230/05:03110911
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	BIST; analog circuit testing; design for testability; fault detection; test generation; testing of electronic systems, diagnostics, (en)
http://linked.open.../riv/klicoveSlovo	fault detection diagnostics design for testability BIST analog circuit testing test generation testing of electronic systems
http://linked.open...ontrolniKodProRIV	[33D41B48415F]
http://linked.open...i/riv/mistoVydani	Praha
http://linked.open...i/riv/nazevZdroje	Handbook of Electronic Testing
http://linked.open...in/vavai/riv/obor	JC
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...v/pocetStranKnihy	405 (xsd:int)
http://linked.open...cetTvurcuVysledku	14 (xsd:int)
http://linked.open...vavai/riv/projekt	Design of highly reliable control systems built on dynamically reconfigurable FPGAs.
http://linked.open...UplatneniVysledku	2005
http://linked.open...iv/tvurceVysledku	Novák, Ondřej Plíva, Z. Garbolino, T. Hlawiczka, A. Drábek, V. Fišerová, M. Gramatová, E. Guczwa, K. Kotásek, Z. Mosin, S. Pleskacz, W. Pleštil, A. Stopjaková, V. Ubar, R.
number of pages	405 (xsd:int)
http://purl.org/ne...btex#hasPublisher	České vysoké učení technické v Praze. Vydavatelství ČVUT
https://schema.org/isbn	80-01-03318-X
http://localhost/t...ganizacniJednotka	21230
is http://linked.open...avai/riv/vysledek of	Handbook of Electronic Testing

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