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rdf:type
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Description
| - Není k dispozici (cs)
- This paper focuses on a fault classification problem for concurrent error detection circuits based on error detecting codes. The proposed fault classification differs from the common classification, where the faults are divided into two groups - the testable faults and the untestable faults. The faults are divided into four groups in our approach, by their impact to fault secure and self-testing properties. Our fault simulation software has been used to evaluate the proposed fault classification on real benchmarks. The benchmarks were implemented in a FPGA, and stuck-at-1 and stuck-at-0 fault model has been considered.
- This paper focuses on a fault classification problem for concurrent error detection circuits based on error detecting codes. The proposed fault classification differs from the common classification, where the faults are divided into two groups - the testable faults and the untestable faults. The faults are divided into four groups in our approach, by their impact to fault secure and self-testing properties. Our fault simulation software has been used to evaluate the proposed fault classification on real benchmarks. The benchmarks were implemented in a FPGA, and stuck-at-1 and stuck-at-0 fault model has been considered. (en)
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Title
| - Fault Classification for Self-checking Circuits Implemented in FPGA
- Není k dispozici (cs)
- Fault Classification for Self-checking Circuits Implemented in FPGA (en)
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skos:prefLabel
| - Fault Classification for Self-checking Circuits Implemented in FPGA
- Není k dispozici (cs)
- Fault Classification for Self-checking Circuits Implemented in FPGA (en)
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skos:notation
| - RIV/68407700:21230/05:03108032!RIV06-GA0-21230___
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http://linked.open.../vavai/riv/strany
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(GA102/04/2137), Z(MSM6840770014)
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68407700:21230/05:03108032
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - fault security, self-testing, fault tolerant,, digital design. testing, FPGA (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...ontrolniKodProRIV
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http://linked.open...v/mistoKonaniAkce
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http://linked.open...i/riv/mistoVydani
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http://linked.open...i/riv/nazevZdroje
| - Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
| - Kafka, Leoš
- Novák, Ondřej
- Kubátová, Hana
- Kubalík, Pavel
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http://linked.open...vavai/riv/typAkce
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http://linked.open.../riv/zahajeniAkce
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http://linked.open...n/vavai/riv/zamer
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number of pages
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http://purl.org/ne...btex#hasPublisher
| - University of Western Hungary
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https://schema.org/isbn
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http://localhost/t...ganizacniJednotka
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is http://linked.open...avai/riv/vysledek
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