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  • We have investigated the effect of irradiation of solid Sn targets with laser pulses of sub-ns duration and sub-mJ energy on the diameter of the extreme ultraviolet (EUV) emitting region and source conversion efficiency. It was found that an in-band EUV source diameter as low as 18 lm was produced due to the short scale length of a plasma produced by a sub-ns laser. Most of the EUV emission occurs in a narrow region with a plasma density close to the critical density value. Such EUV sources are suitable for high brightness and high repetition rate metrology applications.
  • We have investigated the effect of irradiation of solid Sn targets with laser pulses of sub-ns duration and sub-mJ energy on the diameter of the extreme ultraviolet (EUV) emitting region and source conversion efficiency. It was found that an in-band EUV source diameter as low as 18 lm was produced due to the short scale length of a plasma produced by a sub-ns laser. Most of the EUV emission occurs in a narrow region with a plasma density close to the critical density value. Such EUV sources are suitable for high brightness and high repetition rate metrology applications. (en)
Title
  • Evolution of laser-produced Sn extreme ultraviolet source diameter for high-brightness source
  • Evolution of laser-produced Sn extreme ultraviolet source diameter for high-brightness source (en)
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  • Evolution of laser-produced Sn extreme ultraviolet source diameter for high-brightness source
  • Evolution of laser-produced Sn extreme ultraviolet source diameter for high-brightness source (en)
skos:notation
  • RIV/68378271:_____/14:00441167!RIV15-AV0-68378271
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • I, P(ED2.1.00/01.0027), P(EE2.3.20.0143), P(EE2.3.30.0057)
http://linked.open...iv/cisloPeriodika
  • 7
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  • 15573
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  • RIV/68378271:_____/14:00441167
http://linked.open...riv/jazykVysledku
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  • laser-produced plasma; dynamics; EUV source; ultraviolet source; targets (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [F1A7166DC1AD]
http://linked.open...i/riv/nazevZdroje
  • Applied Physics Letters
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http://linked.open...v/svazekPeriodika
  • 105
http://linked.open...iv/tvurceVysledku
  • Mocek, Tomáš
  • Roy, Amitava
  • Hara, H.
  • Li, B.
  • Sunahara, A.
  • Endo, Akira
  • Dunne, P.
  • Higashiguchi, T.
  • Ohashi, H.
  • Miura, Taisuke
  • Arai, G.
  • O´Sullivan, G.
http://linked.open...ain/vavai/riv/wos
  • 000341189800113
issn
  • 0003-6951
number of pages
http://bibframe.org/vocab/doi
  • 10.1063/1.4893611
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