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Description
| - We investigated the initial and secondary oxidation products on the Si(111)-(7x7) surface at room temperature using atomic force microscopy (AFM), scanning tunneling microscopy (STM), and density functional theory calculations. We found the atomic structure of these products. The initial and secondary oxidation products appear as bright and dark sites, respectively, STM. It was shown that the topographic information given by AFM was close to the real atomic corrugation of the oxygen-containing structures on the semiconductor surfaces.
- We investigated the initial and secondary oxidation products on the Si(111)-(7x7) surface at room temperature using atomic force microscopy (AFM), scanning tunneling microscopy (STM), and density functional theory calculations. We found the atomic structure of these products. The initial and secondary oxidation products appear as bright and dark sites, respectively, STM. It was shown that the topographic information given by AFM was close to the real atomic corrugation of the oxygen-containing structures on the semiconductor surfaces. (en)
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Title
| - Initial and secondary oxidation products on the Si(111)-(7x7) surface identified by atomic force microscopy and first principles calculations
- Initial and secondary oxidation products on the Si(111)-(7x7) surface identified by atomic force microscopy and first principles calculations (en)
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skos:prefLabel
| - Initial and secondary oxidation products on the Si(111)-(7x7) surface identified by atomic force microscopy and first principles calculations
- Initial and secondary oxidation products on the Si(111)-(7x7) surface identified by atomic force microscopy and first principles calculations (en)
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skos:notation
| - RIV/68378271:_____/14:00432274!RIV15-GA0-68378271
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68378271:_____/14:00432274
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - silicon surface; oxidation; atomic force microscopy; scanning tunneling microscopy; first principles calculations (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - US - Spojené státy americké
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Jelínek, Pavel
- Ondráček, Martin
- Sugimoto, Y.
- Yurtsever, A.
- Onoda, J.
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http://linked.open...ain/vavai/riv/wos
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issn
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number of pages
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http://bibframe.org/vocab/doi
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