About: Light trapping in thin-film solar cells measured by Raman spectroscopy

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: Light trapping in thin-film solar cells measured by Raman spectroscopy Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In this study, Raman spectroscopy is used as a tool to determine the light-trapping capability of textured ZnO front electrodes implemented in microcrystalline silicon (µc-Si:H) solar cells. Microcrystalline silicon films deposited on superstrates of various roughnesses are characterized by Raman micro-spectroscopy at excitation wavelengths of 442nm, 514nm, 633nm, and 785nm, respectively. The way to measure quantitatively and with a high level of reproducibility the Raman intensity is described in details. By varying the superstrate texture and with it the light trapping in the µc-Si:H absorber layer, we find significant differences in the absolute Raman intensity measured in the near infrared wavelength region (where light trapping is relevant). A good agreement between the absolute Raman intensity and the external quantum efficiency of the µc-Si:H solar cells is obtained, demonstrating the validity of the introduced method. In this study, Raman spectroscopy is used as a tool to determine the light-trapping capability of textured ZnO front electrodes implemented in microcrystalline silicon (µc-Si:H) solar cells. Microcrystalline silicon films deposited on superstrates of various roughnesses are characterized by Raman micro-spectroscopy at excitation wavelengths of 442nm, 514nm, 633nm, and 785nm, respectively. The way to measure quantitatively and with a high level of reproducibility the Raman intensity is described in details. By varying the superstrate texture and with it the light trapping in the µc-Si:H absorber layer, we find significant differences in the absolute Raman intensity measured in the near infrared wavelength region (where light trapping is relevant). A good agreement between the absolute Raman intensity and the external quantum efficiency of the µc-Si:H solar cells is obtained, demonstrating the validity of the introduced method. (en)
Title	Light trapping in thin-film solar cells measured by Raman spectroscopy Light trapping in thin-film solar cells measured by Raman spectroscopy (en)
skos:prefLabel	Light trapping in thin-film solar cells measured by Raman spectroscopy Light trapping in thin-film solar cells measured by Raman spectroscopy (en)
skos:notation	RIV/68378271:_____/14:00432256!RIV15-GA0-68378271
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(7E12029), P(GA14-15357S), P(LM2011026)
http://linked.open...iv/cisloPeriodika	11
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Ganzerová, Kristína Fejfar, Antonín Ledinský, Martin Vetushka, Aliaksi
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	26200
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/14:00432256
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	light trapping; microcrystalline silicon; thin film solar cell; Raman spectroscopy (en)
http://linked.open.../riv/klicoveSlovo	light trapping microcrystalline silicon Raman spectroscopy thin film solar cell
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[E2A84819AEA5]
http://linked.open...i/riv/nazevZdroje	Applied Physics Letters
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	8 (xsd:int)
http://linked.open...vavai/riv/projekt	Accelerated development and prototyping of nano-technology-based high-efficiency thin-film silicon solar modules (%22Fast Track%22) Laboratory of nanstructures and nanomaterials Strain engineering of electronic structure in graphene
http://linked.open...UplatneniVysledku	2014
http://linked.open...v/svazekPeriodika	105
http://linked.open...iv/tvurceVysledku	Ledinský, Martin Fejfar, Antonín Ballif, C. Vetushka, Aliaksi Bugnon, G. Meillaud, F. Ganzerová, Kristína Moulin, E.
http://linked.open...ain/vavai/riv/wos	000342995800007
issn	0003-6951
number of pages	4 (xsd:int)
http://bibframe.org/vocab/doi	10.1063/1.4895931

Faceted Search & Find service v1.16.118 as of Jun 21 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 117 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software