About: Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications

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About: Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications Goto Sponge NotDistinct Permalink

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In this work, a group of Lu2SiO5:Tb (LSO:Tb) scintillating layers with a Tb concentration between 8% and 19% were investigated by means of synchrotron and laboratory techniques. The scintillation efficiency measurements proved that the highest light yield is obtained for a Tb concentration equal to 15%. At higher concentration, quenching processes occur which lower the light emission. The analysis of the reciprocal space maps of the (082) (280) and (040) Bragg reflections showed that LSO:Tb epilayers are well adapted on YbSO substrates for all the investigated concentrations. The spatial resolution tests demonstrated the possibility to achieve a resolution of 1 μm with a 6 μm thick scintillating layer. In this work, a group of Lu2SiO5:Tb (LSO:Tb) scintillating layers with a Tb concentration between 8% and 19% were investigated by means of synchrotron and laboratory techniques. The scintillation efficiency measurements proved that the highest light yield is obtained for a Tb concentration equal to 15%. At higher concentration, quenching processes occur which lower the light emission. The analysis of the reciprocal space maps of the (082) (280) and (040) Bragg reflections showed that LSO:Tb epilayers are well adapted on YbSO substrates for all the investigated concentrations. The spatial resolution tests demonstrated the possibility to achieve a resolution of 1 μm with a 6 μm thick scintillating layer. (en)
Title	Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications (en)
skos:prefLabel	Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications (en)
skos:notation	RIV/68378271:_____/14:00432054!RIV15-GA0-68378271
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(GAP204/12/0805)
http://linked.open...iv/cisloPeriodika	MAR
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Mihóková, Eva Nikl, Martin Jarý, Vítězslav
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	22769
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/14:00432054
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	LSO:Tb; X-ray imaging; indirect detector (en)
http://linked.open.../riv/klicoveSlovo	X-ray imaging LSO:Tb indirect detector
http://linked.open...odStatuVydavatele	GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV	[79D7A37AB1B1]
http://linked.open...i/riv/nazevZdroje	Radiation Measurements
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	13 (xsd:int)
http://linked.open...vavai/riv/projekt	Advanced material solutions for thin film scintillators and light transformers
http://linked.open...UplatneniVysledku	2014
http://linked.open...v/svazekPeriodika	62
http://linked.open...iv/tvurceVysledku	Fiederle, M. Mihóková, Eva Nikl, Martin Baumbach, T. Krause, B. Cecilia, A. Hamann, E. Jarý, Vítězslav Rack, A. Douissard, P.-A. Martin, T. Grigorievc, D. Hänschke, D.
http://linked.open...ain/vavai/riv/wos	000334003200006
issn	1350-4487
number of pages	7 (xsd:int)
http://bibframe.org/vocab/doi	10.1016/j.radmeas.2013.12.005

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