About: Nano-level characterization of silicon thin films and solar cells

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Thin film based solar cells are surprisingly complex devices, mainly due to their micro and nanostructure. The nanostructure may be due to naturally occurring heterogeneities, for example crystalline grains, grain boundaries, defects in microcrystalline silicon, CdTe or CIS layers). The nanostructure is often part of the solar cell design, for example in bulk heterojunction cells or dye sensitized cells. In novel types of the cells nanostructured electrodes or light trapping structures are often used to improve the photovoltaic conversion efficiency. Nanometer-scale characterization using the scanning probe methods can provide information not only about the structure, but also about the functionality such as dark and illuminated surface potential, dark and illuminated conductivity, dielectric constant etc. Here, the experiments based on atomic force microscopy with conductive cantilever used as local contact are reviewed for the case of mixed phase silicon thin films. Thin film based solar cells are surprisingly complex devices, mainly due to their micro and nanostructure. The nanostructure may be due to naturally occurring heterogeneities, for example crystalline grains, grain boundaries, defects in microcrystalline silicon, CdTe or CIS layers). The nanostructure is often part of the solar cell design, for example in bulk heterojunction cells or dye sensitized cells. In novel types of the cells nanostructured electrodes or light trapping structures are often used to improve the photovoltaic conversion efficiency. Nanometer-scale characterization using the scanning probe methods can provide information not only about the structure, but also about the functionality such as dark and illuminated surface potential, dark and illuminated conductivity, dielectric constant etc. Here, the experiments based on atomic force microscopy with conductive cantilever used as local contact are reviewed for the case of mixed phase silicon thin films. (en)
Title	Nano-level characterization of silicon thin films and solar cells Nano-level characterization of silicon thin films and solar cells (en)
skos:prefLabel	Nano-level characterization of silicon thin films and solar cells Nano-level characterization of silicon thin films and solar cells (en)
skos:notation	RIV/68378271:_____/13:00424738!RIV14-MSM-68378271
http://linked.open...avai/predkladatel	Fyzikální ústav AV ČR, v.v.i.
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(LM2011026)
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Fejfar, Antonín
http://linked.open.../riv/druhVysledku	C - Kapitola v knize
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	90604
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/13:00424738
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	silicon; thin films; atomic force microscopy; photoresponse (en)
http://linked.open.../riv/klicoveSlovo	silicon thin films atomic force microscopy photoresponse
http://linked.open...ontrolniKodProRIV	[DBCC9A8D07A7]
http://linked.open...i/riv/mistoVydani	Tokyo
http://linked.open...i/riv/nazevZdroje	Solar Cell Technology Handbook
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...v/pocetStranKnihy	1018 (xsd:int)
http://linked.open...cetTvurcuVysledku	1 (xsd:int)
http://linked.open...vavai/riv/projekt	Laboratory of nanstructures and nanomaterials
http://linked.open...UplatneniVysledku	2013
http://linked.open...iv/tvurceVysledku	Fejfar, Antonín
number of pages	11 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Ohmsha
https://schema.org/isbn	978-4-274-21399-1

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