About: On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation

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About: On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation Goto Sponge NotDistinct Permalink

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Textures, stresses, and strains, as well as the overall so-called real structure, are crucial for properties of thin films deposited by different methods and can have both positive and negative effects depending on the film and its application. They were studied by a combination of different X-ray diffraction (XRD) techniques for several ZnO films. The films prepared by pulsed laser deposition (PLD) on MgO and sapphire single-crystalline substrates and amorphous-fused silica showed different kinds of strong preferred orientation and also different stresses that could be estimated only from the analysis of quite narrow, nonzero intensity regions of diffraction spots. XRD line broadening was analyzed by a combination of different asymmetric scans. Fiber (0001) texture and tensile residual stresses were found on fused silica, while domains with local epitaxy and huge compressive ... Textures, stresses, and strains, as well as the overall so-called real structure, are crucial for properties of thin films deposited by different methods and can have both positive and negative effects depending on the film and its application. They were studied by a combination of different X-ray diffraction (XRD) techniques for several ZnO films. The films prepared by pulsed laser deposition (PLD) on MgO and sapphire single-crystalline substrates and amorphous-fused silica showed different kinds of strong preferred orientation and also different stresses that could be estimated only from the analysis of quite narrow, nonzero intensity regions of diffraction spots. XRD line broadening was analyzed by a combination of different asymmetric scans. Fiber (0001) texture and tensile residual stresses were found on fused silica, while domains with local epitaxy and huge compressive ... (en)
Title	On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation (en)
skos:prefLabel	On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation (en)
skos:notation	RIV/68378271:_____/13:00396259!RIV14-GA0-68378271
http://linked.open...avai/predkladatel	Fyzikální ústav AV ČR, v.v.i.
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(GAP108/11/0958), P(GAP108/11/1539)
http://linked.open...iv/cisloPeriodika	1
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Novotný, Michal
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	94001
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/13:00396259
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	zinc oxide thin film; X-ray diffraction; Mg0; fused silica (en)
http://linked.open.../riv/klicoveSlovo	X-ray diffraction fused silica Mg0 zinc oxide thin film
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[C2F4C65ECE12]
http://linked.open...i/riv/nazevZdroje	Metallurgical and Materials Transactions A
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Investigation of point defects in ZnO and their interaction with hydrogen and nitrogen Nanocrystalline materials - X-ray characterization of structure and its thermal stability
http://linked.open...UplatneniVysledku	2013
http://linked.open...v/svazekPeriodika	44A
http://linked.open...iv/tvurceVysledku	Novotný, Michal Kužel, R. Čížek, J.
http://linked.open...ain/vavai/riv/wos	000313718500009
issn	1073-5623
number of pages	13 (xsd:int)
http://bibframe.org/vocab/doi	10.1007/s11661-012-1432-x

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