About: Artifacts in atomic force microscopy of biological samples

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: Artifacts in atomic force microscopy of biological samples Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Atomic force microscopy (AFM) is a frequently used method applicable also to biological studies due to its capability of measuring in native environment. However, AFM images often contain features which are not present on the sample in reality, but are a direct result of the measurements itself. Such structures or features are denoted as artifacts. The artifacts arise from various reasons. Some of them can be avoided during measurements, other ones are inherent. The artifacts shown in this chapter are divided into several categories based on the part of AFM which is responsible for them. Examples of many artifacts are presented and their reasons are explained. This chapter will be helpful for AFM users who observe strange effects, presumably related to the AFM technique, but do not know their reason. This chapter can also answer questions about the validity of imaged features as well as their accuracy. Atomic force microscopy (AFM) is a frequently used method applicable also to biological studies due to its capability of measuring in native environment. However, AFM images often contain features which are not present on the sample in reality, but are a direct result of the measurements itself. Such structures or features are denoted as artifacts. The artifacts arise from various reasons. Some of them can be avoided during measurements, other ones are inherent. The artifacts shown in this chapter are divided into several categories based on the part of AFM which is responsible for them. Examples of many artifacts are presented and their reasons are explained. This chapter will be helpful for AFM users who observe strange effects, presumably related to the AFM technique, but do not know their reason. This chapter can also answer questions about the validity of imaged features as well as their accuracy. (en)
Title	Artifacts in atomic force microscopy of biological samples Artifacts in atomic force microscopy of biological samples (en)
skos:prefLabel	Artifacts in atomic force microscopy of biological samples Artifacts in atomic force microscopy of biological samples (en)
skos:notation	RIV/68378271:_____/12:00390150!RIV13-AV0-68378271
http://linked.open...avai/predkladatel	Fyzikální ústav AV ČR, v.v.i.
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(KAN400100701), P(LC06040), P(LC510), Z(AV0Z10100521)
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Remeš, Zdeněk Kromka, Alexander Rezek, Bohuslav Ukraintsev, Egor Kozak, Halyna
http://linked.open.../riv/druhVysledku	C - Kapitola v knize
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	123704
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/12:00390150
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	atomic force microscopy (AFM); validity of measurement; accuracy of measurement (en)
http://linked.open.../riv/klicoveSlovo	accuracy of measurement validity of measurement atomic force microscopy (AFM)
http://linked.open...ontrolniKodProRIV	[8F21FB8BF4DD]
http://linked.open...i/riv/mistoVydani	Rijeka
http://linked.open...i/riv/nazevZdroje	Atomic Force Microscopy Investigations into Biology - From Cell to Protein
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...v/pocetStranKnihy	354 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Center of nanotechnology and materials for nanoelectronics Functional hybrid nanosystems of semiconductors and metals with organic materials (FUNS) Structures for Nanophotonics and Nanoelectronics
http://linked.open...UplatneniVysledku	2012
http://linked.open...iv/tvurceVysledku	Kromka, Alexander Rezek, Bohuslav Ukraintsev, Egor Remeš, Zdeněk Kozak, Halyna
http://linked.open...n/vavai/riv/zamer	Physics and technology of nanostructures, surfaces and thin films
number of pages	26 (xsd:int)
http://bibframe.org/vocab/doi	10.5772/2092
http://purl.org/ne...btex#hasPublisher	InTech
https://schema.org/isbn	978-953-51-0114-7
is http://linked.open...avai/riv/vysledek of	Artifacts in atomic force microscopy of biological samples

Faceted Search & Find service v1.16.118 as of Jun 21 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 77 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software