About: Local photoconductivity of microcrystalline silicon thin films measured by conductive atomic force microscopy

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Local currents measured under standard conductive atomic force microscopy (C-AFM) conditions on microcrystalline silicon (µc-Si:H) thin films were studied. It was shown that the AFM detection diode illuminating the AFM cantilever (see the figure on the right side) 100 enhanced the current flows through the photosensitive µc-Si:H layer. The local current map and current–voltage characteristics were measured under dark conditions. This study enables mapping of both the dark current and photocurrent. Local currents measured under standard conductive atomic force microscopy (C-AFM) conditions on microcrystalline silicon (µc-Si:H) thin films were studied. It was shown that the AFM detection diode illuminating the AFM cantilever (see the figure on the right side) 100 enhanced the current flows through the photosensitive µc-Si:H layer. The local current map and current–voltage characteristics were measured under dark conditions. This study enables mapping of both the dark current and photocurrent. (en)
Title	Local photoconductivity of microcrystalline silicon thin films measured by conductive atomic force microscopy Local photoconductivity of microcrystalline silicon thin films measured by conductive atomic force microscopy (en)
skos:prefLabel	Local photoconductivity of microcrystalline silicon thin films measured by conductive atomic force microscopy Local photoconductivity of microcrystalline silicon thin films measured by conductive atomic force microscopy (en)
skos:notation	RIV/68378271:_____/11:00372226!RIV12-AV0-68378271
http://linked.open...avai/predkladatel	Fyzikální ústav AV ČR, v.v.i.
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(KAN400100701), P(LC06040), P(LC510), P(MEB061012), Z(AV0Z10100521)
http://linked.open...iv/cisloPeriodika	10-11
http://linked.open...vai/riv/dodaniDat	2012
http://linked.open...aciTvurceVysledku	Fejfar, Antonín Ledinský, Martin Stuchlík, Jiří Rezek, Bohuslav Vetushka, Aliaksi Kočka, Jan
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	209805
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/11:00372226
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	amorphous silicon; nanocrystalline silicon; thin films; atomic force microscopy; photoconductivity (en)
http://linked.open.../riv/klicoveSlovo	amorphous silicon nanocrystalline silicon photoconductivity thin films atomic force microscopy
http://linked.open...odStatuVydavatele	DE - Spolková republika Německo
http://linked.open...ontrolniKodProRIV	[C6F15D61646E]
http://linked.open...i/riv/nazevZdroje	Physica Status Solidi-Rapid Research Letters
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	6 (xsd:int)
http://linked.open...cetTvurcuVysledku	6 (xsd:int)
http://linked.open...vavai/riv/projekt	Center of nanotechnology and materials for nanoelectronics Study of nanostructured heterogeneous materials using scanning probe methods Functional hybrid nanosystems of semiconductors and metals with organic materials (FUNS) Structures for Nanophotonics and Nanoelectronics
http://linked.open...UplatneniVysledku	2011
http://linked.open...v/svazekPeriodika	5
http://linked.open...iv/tvurceVysledku	Rezek, Bohuslav Ledinský, Martin Fejfar, Antonín Stuchlík, Jiří Kočka, Jan Vetushka, Aliaksi
http://linked.open...ain/vavai/riv/wos	000297747600006
http://linked.open...n/vavai/riv/zamer	Physics and technology of nanostructures, surfaces and thin films
issn	1862-6254
number of pages	3 (xsd:int)
http://bibframe.org/vocab/doi	10.1002/pssr.201105413
is http://linked.open...avai/riv/vysledek of	Local photoconductivity of microcrystalline silicon thin films measured by conductive atomic force microscopy Local photoconductivity of microcrystalline silicon thin films measured by conductive atomic force microscopy

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