About: Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments

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About: Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	We are developing n+-in-p, p-bulk and n-readout, microstrip sensors, fabricated by Hamamatsu Photonics, as a non-inverting radiation hard silicon detector for the ATLAS tracker upgrade at the super-LHC (sLHC) proposed facility. The bulk radiation damage after neutron and proton irradiations is characterized with the leakage current, charge collection and full depletion voltage. The detectors should provide acceptable signal, signal-to-noise ratio exceeding 15, after the integrated luminosity of 6000 fb1, which is twice the sLHC integrated luminosity goal. We are developing n+-in-p, p-bulk and n-readout, microstrip sensors, fabricated by Hamamatsu Photonics, as a non-inverting radiation hard silicon detector for the ATLAS tracker upgrade at the super-LHC (sLHC) proposed facility. The bulk radiation damage after neutron and proton irradiations is characterized with the leakage current, charge collection and full depletion voltage. The detectors should provide acceptable signal, signal-to-noise ratio exceeding 15, after the integrated luminosity of 6000 fb1, which is twice the sLHC integrated luminosity goal. (en)
Title	Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments (en)
skos:prefLabel	Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments (en)
skos:notation	RIV/68378271:_____/11:00361428!RIV13-AV0-68378271
http://linked.open...avai/predkladatel	Fyzikální ústav AV ČR, v.v.i.
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(LA08032), Z(AV0Z10100502), Z(MSM0021620859)
http://linked.open...iv/cisloPeriodika	1
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Böhm, Jan Mikeštíková, Marcela
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	234906
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/11:00361428
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	p-bulk silicon; microstrip; charge collection; radiation damage (en)
http://linked.open.../riv/klicoveSlovo	charge collection p-bulk silicon radiation damage microstrip
http://linked.open...odStatuVydavatele	NL - Nizozemsko
http://linked.open...ontrolniKodProRIV	[4EE64FF2A213]
http://linked.open...i/riv/nazevZdroje	Nuclear Instruments & Methods in Physics Research Section A
http://linked.open...in/vavai/riv/obor	BF
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	74 (xsd:int)
http://linked.open...vavai/riv/projekt	International experiment ATLAS-CERN
http://linked.open...UplatneniVysledku	2011
http://linked.open...v/svazekPeriodika	636
http://linked.open...iv/tvurceVysledku	Böhm, Jan Bates, R. Mikeštíková, Marcela Affolder, A. A. Allport, P. P. Betancourt, C. Brown, H. Buttar, C. Carter, J. R. Casse, G. Hara, K.
http://linked.open...ain/vavai/riv/wos	000291416400015
http://linked.open...n/vavai/riv/zamer	Jevy fyziky elementárních částic přesahující standardní model Výzkum vlastností jader a subjaderných částic a jejich interakcí
issn	0168-9002
number of pages	7 (xsd:int)
http://bibframe.org/vocab/doi	10.1016/j.nima.2010.04.090
is http://linked.open...avai/riv/vysledek of	Testing of bulk radiation damage of n-in-p silicon sensors for very high radiation environments

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