About: Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The emission of Fe ions and ionized admixtures of silicon, carbon, oxygen and hydrogen generated by a Nd:YAG laser (I 1x10^10 W/cm^2) is investigated with the use of ion collectors (IC) and a cylindrical electrostatic ion mass analyzer (CEA). The partial currents of ion species are reconstructed from a set of CEA spectra obtained by changing the voltage between the CEA's cylindrical deflecting plates. The basic difference between the sum of all the reconstructed partial currents and the corresponding IC current is analyzed and the reasons for differences are specified. The emission of Fe ions and ionized admixtures of silicon, carbon, oxygen and hydrogen generated by a Nd:YAG laser (I 1x10^10 W/cm^2) is investigated with the use of ion collectors (IC) and a cylindrical electrostatic ion mass analyzer (CEA). The partial currents of ion species are reconstructed from a set of CEA spectra obtained by changing the voltage between the CEA's cylindrical deflecting plates. The basic difference between the sum of all the reconstructed partial currents and the corresponding IC current is analyzed and the reasons for differences are specified. (en)
Title	Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources (en)
skos:prefLabel	Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources (en)
skos:notation	RIV/68378271:_____/10:00352581!RIV11-MSM-68378271
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(IAA100100715), P(LC528), Z(AV0Z10100523)
http://linked.open...iv/cisloPeriodika	6-10
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Rohlena, Karel Velyhan, Andriy Krása, Josef Láska, Leoš
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	268533
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/10:00352581
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	laser-produced plasma; time-resolved current deconvolution; ion velocity distribution; drift velocity of ions (en)
http://linked.open.../riv/klicoveSlovo	laser-produced plasma drift velocity of ions ion velocity distribution time-resolved current deconvolution
http://linked.open...odStatuVydavatele	GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV	[20BB2873FA78]
http://linked.open...i/riv/nazevZdroje	Radiation Effects and Defects in Solids
http://linked.open...in/vavai/riv/obor	BL
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	8 (xsd:int)
http://linked.open...vavai/riv/projekt	Centre of Laser Plasma Studies of non-linear processes participating in laser-generation of ions with extremely high characteristics
http://linked.open...UplatneniVysledku	2010
http://linked.open...v/svazekPeriodika	165
http://linked.open...iv/tvurceVysledku	Krása, Josef Láska, Leoš Rohlena, Karel Velyhan, Andriy Czarnecka, A. Parys, P. Ryc, L. Wolowski, J.
http://linked.open...ain/vavai/riv/wos	000281854500007
http://linked.open...n/vavai/riv/zamer	Intense Radiation Sources and Radiation-Matter Interaction
issn	1042-0150
number of pages	10 (xsd:int)
is http://linked.open...avai/riv/vysledek of	Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources

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