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Description
| - Monoclinic and tetragonal zirconia samples were characterized by X-ray diffraction, pycnometry, thermogravimetric analysis (TGA), Fourier transform (FT) IR and mass (MS) spectroscopies, and scanning and transmission electron (TEM) microscopies. The results show, for the particular case of a tetragonal zirconia sample, an X-ray-undetected subproduct identified as an amorphous organic phase by FTIR–ATR (attenuated total reflection) and TGA–MS. The observations by TEM allowed this amorphous phase to be localized on the surface as a shell coating the nanoparticles. Moreover, this amorphous phase was quantified by Rietveld refinement via the addition of an internal silicon standard.
- Monoclinic and tetragonal zirconia samples were characterized by X-ray diffraction, pycnometry, thermogravimetric analysis (TGA), Fourier transform (FT) IR and mass (MS) spectroscopies, and scanning and transmission electron (TEM) microscopies. The results show, for the particular case of a tetragonal zirconia sample, an X-ray-undetected subproduct identified as an amorphous organic phase by FTIR–ATR (attenuated total reflection) and TGA–MS. The observations by TEM allowed this amorphous phase to be localized on the surface as a shell coating the nanoparticles. Moreover, this amorphous phase was quantified by Rietveld refinement via the addition of an internal silicon standard. (en)
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Title
| - Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO2 nanoparticles
- Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO2 nanoparticles (en)
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skos:prefLabel
| - Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO2 nanoparticles
- Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO2 nanoparticles (en)
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skos:notation
| - RIV/68378271:_____/10:00349618!RIV11-AV0-68378271
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68378271:_____/10:00349618
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - x-ray diffraction; Rietveld refinement; nanoparticles (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - GB - Spojené království Velké Británie a Severního Irska
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - Journal of Applied Crystallography
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Petříček, Václav
- Gautron, E.
- Deniard, P.
- Grambow, B.
- Jobic, S.
- Suzuki-Muresan, T.
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http://linked.open...ain/vavai/riv/wos
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http://linked.open...n/vavai/riv/zamer
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issn
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number of pages
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is http://linked.open...avai/riv/vysledek
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