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  • The time resolved reflectance anisotropy spectroscopy (RAS) measurement at 4.2 eV was used for the optimization of technological parameters for Stranski-Krastanow quantum dot (QD) formation. RAS measurement helps us to study the MOVPE surface processes such as QD formation, dissolution of In from InAs QDs during the growth of GaAs capping layer or recovery of epitaxial surface from As deficiency, when As partial pressure is increased. We have shown, that the recovery of epitaxial surface from As deficiency is rather a slow process of the order of tens of seconds. For the first time was observed in situ the mechanism of In atoms migration from QDs during GaAs capping layer growth. First the GaAs layer is formed and then the In migration from QDs follows. These two processes do not start at the same time, the In dissolution is delayed. Conclusions extracted from RAS measurement are in agreement with photoluminescence results.
  • The time resolved reflectance anisotropy spectroscopy (RAS) measurement at 4.2 eV was used for the optimization of technological parameters for Stranski-Krastanow quantum dot (QD) formation. RAS measurement helps us to study the MOVPE surface processes such as QD formation, dissolution of In from InAs QDs during the growth of GaAs capping layer or recovery of epitaxial surface from As deficiency, when As partial pressure is increased. We have shown, that the recovery of epitaxial surface from As deficiency is rather a slow process of the order of tens of seconds. For the first time was observed in situ the mechanism of In atoms migration from QDs during GaAs capping layer growth. First the GaAs layer is formed and then the In migration from QDs follows. These two processes do not start at the same time, the In dissolution is delayed. Conclusions extracted from RAS measurement are in agreement with photoluminescence results. (en)
Title
  • Surface processes during growth of InAs/GaAs quantum dot structures monitored by reflectance anisotropy spectroscopy
  • Surface processes during growth of InAs/GaAs quantum dot structures monitored by reflectance anisotropy spectroscopy (en)
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  • Surface processes during growth of InAs/GaAs quantum dot structures monitored by reflectance anisotropy spectroscopy
  • Surface processes during growth of InAs/GaAs quantum dot structures monitored by reflectance anisotropy spectroscopy (en)
skos:notation
  • RIV/68378271:_____/10:00342088!RIV11-GA0-68378271
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA202/09/0676), P(IAA100100719), Z(AV0Z10100521)
http://linked.open...iv/cisloPeriodika
  • 3-4
http://linked.open...vai/riv/dodaniDat
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  • 291151
http://linked.open...ai/riv/idVysledku
  • RIV/68378271:_____/10:00342088
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • low-pressure Metal–Organic Vapor Phase; InAs/GaAs quantum dots; reflectance anisotropy spectroscopy Surface reconstruction; surface reconstruction (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [BD21CE9E8209]
http://linked.open...i/riv/nazevZdroje
  • Surface Science
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
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http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 604
http://linked.open...iv/tvurceVysledku
  • Hulicius, Eduard
  • Pangrác, Jiří
  • Hospodková, Alice
  • Kuldová, Karla
  • Oswald, Jiří
  • Vyskočil, Jan
http://linked.open...ain/vavai/riv/wos
  • 00027497900001
http://linked.open...n/vavai/riv/zamer
issn
  • 0039-6028
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