About: Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation

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About: Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation Goto Sponge NotDistinct Permalink

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	We exposed bulk SiC and films of SiC and B4C to single 25 fs long free-electron-laser pulses with wavelengths between 13.5 and 32 nm. The materials are candidates for x-ray free-electron laser optics. We found that the threshold for surface-damage of the bulk SiC samples exceeds the fluence required for thermal melting at all wavelengths. The damage threshold of the film sample shows a strong wavelength dependence. For wavelengths of 13.5 and 21.7 nm, the damage threshold is equal to or exceeds the melting threshold, whereas at 32 nm the damage threshold falls below the melting threshold. We exposed bulk SiC and films of SiC and B4C to single 25 fs long free-electron-laser pulses with wavelengths between 13.5 and 32 nm. The materials are candidates for x-ray free-electron laser optics. We found that the threshold for surface-damage of the bulk SiC samples exceeds the fluence required for thermal melting at all wavelengths. The damage threshold of the film sample shows a strong wavelength dependence. For wavelengths of 13.5 and 21.7 nm, the damage threshold is equal to or exceeds the melting threshold, whereas at 32 nm the damage threshold falls below the melting threshold. (en)
Title	Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation (en)
skos:prefLabel	Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation (en)
skos:notation	RIV/68378271:_____/09:00334092!RIV10-MSM-68378271
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(IAA400100701), P(KAN300100702), P(LA08024), P(LC510), P(LC528), Z(AV0Z10100523)
http://linked.open...iv/cisloPeriodika	11
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Cihelka, Jaroslav Chalupský, Jaromír Hájková, Věra Juha, Libor Velyhan, Andriy Krása, Josef
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	351744
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/09:00334092
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	damage threshold; silicon carbide; boron carbide; soft X-ray free-electron laser (en)
http://linked.open.../riv/klicoveSlovo	silicon carbide damage threshold boron carbide soft X-ray free-electron laser
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[F4C62613479A]
http://linked.open...i/riv/nazevZdroje	Applied Physics Letters
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	6 (xsd:int)
http://linked.open...cetTvurcuVysledku	26 (xsd:int)
http://linked.open...vavai/riv/projekt	Center of nanotechnology and materials for nanoelectronics Creating and probing nanostructures with X-ray lasers Research in the Frame of the International Center for Dense Magnetized Plasmas - ICDMP Centre of Laser Plasma Metal-Fullerene and Metal-Diamond Nanocomposites: Preparation, Characterization and Modification
http://linked.open...UplatneniVysledku	2009
http://linked.open...v/svazekPeriodika	95
http://linked.open...iv/tvurceVysledku	Chalupský, Jaromír Hau-Riege, S. P. Hájková, Věra Juha, Libor Krzywinski, J. Krása, Josef Cihelka, Jaroslav Jurek, M. Klinger, D. Pelka, J. B. Sobierajski, R. Tiedtke, K. Toleikis, S. Wabnitz, H. Velyhan, Andriy Soufli, R. Bajt, S. Bergh, M. Caleman, C. Timneanu, N. London, R. A. Baker, S. L. Nietubyc, R. Bionta, R. M. McKernan, M. A. Ryutov, D.
http://linked.open...ain/vavai/riv/wos	000270096900004
http://linked.open...n/vavai/riv/zamer	Intense Radiation Sources and Radiation-Matter Interaction
issn	0003-6951
number of pages	3 (xsd:int)
is http://linked.open...avai/riv/vysledek of	Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation

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