About: Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses     Goto   Sponge   NotDistinct   Permalink

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  • We report the first observation of single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly ( methyl methacrylate) - PMMA. Irradiated by the focused beam from the Free-electron LASer in Hamburg ( FLASH) at 21.7nm, the samples have been investigated by atomic-force microscope (AFM) enabling the visualization of mild surface modifications caused by the desorption. A model describing non-thermal desorption and ablation has been developed and used to analyze single-shot imprints in PMMA. An intermediate regime of materials removal has been found, confirming model predictions. We also report below-threshold multiple-shot desorption of PMMA induced by high-order harmonics (HOH) at 32nm. Short-time exposure imprints provide sufficient information about transverse beam profile in HOH's tight focus whereas long-time exposed PMMA exhibits radiation-initiated surface hardening making the beam profile measurement infeasible.
  • We report the first observation of single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly ( methyl methacrylate) - PMMA. Irradiated by the focused beam from the Free-electron LASer in Hamburg ( FLASH) at 21.7nm, the samples have been investigated by atomic-force microscope (AFM) enabling the visualization of mild surface modifications caused by the desorption. A model describing non-thermal desorption and ablation has been developed and used to analyze single-shot imprints in PMMA. An intermediate regime of materials removal has been found, confirming model predictions. We also report below-threshold multiple-shot desorption of PMMA induced by high-order harmonics (HOH) at 32nm. Short-time exposure imprints provide sufficient information about transverse beam profile in HOH's tight focus whereas long-time exposed PMMA exhibits radiation-initiated surface hardening making the beam profile measurement infeasible. (en)
Title
  • Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses
  • Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses (en)
skos:prefLabel
  • Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses
  • Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses (en)
skos:notation
  • RIV/68378271:_____/09:00334060!RIV10-MSM-68378271
http://linked.open...avai/riv/aktivita
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  • P(IAA400100701), P(KAN300100702), P(LA08024), P(LC510), P(LC528), Z(AV0Z10100523)
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  • 1
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  • 329752
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  • RIV/68378271:_____/09:00334060
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  • x-ray laser; high-order harmonics; free-electron laser; desorption; ablation; organic polymer (en)
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  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [C0A78AA9A16A]
http://linked.open...i/riv/nazevZdroje
  • Optics Express
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  • 17
http://linked.open...iv/tvurceVysledku
  • Chalupský, Jaromír
  • Gautier, J.
  • Hau-Riege, S. P.
  • Hájková, Věra
  • Juha, Libor
  • Krzywinski, J.
  • Sebban, S.
  • Vyšín, Luděk
  • Zeitoun, P.
  • Cihelka, Jaroslav
  • Jurek, M.
  • Pelka, J. B.
  • Sobierajski, R.
  • Tiedtke, K.
  • Toleikis, S.
  • Tschentscher, T.
  • Wabnitz, H.
  • Hajdu, J.
  • London, R. A.
  • Valentin, C.
  • Rey, G.
  • Stojanovic, N.
  • Papalazarou, E.
http://linked.open...ain/vavai/riv/wos
  • 000262220300024
http://linked.open...n/vavai/riv/zamer
issn
  • 1094-4087
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