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Description
  • Field-enhanced metal-induced solid phase crystallization (FE-MISPC) at room temperature is employed to create microscopic crystalline regions at predefined positions in hydrogen-rich amorphous silicon (a-Si:H) films. Electric field is applied locally using a sharp conductive tip in atomic force microscope (AFM) and nickel electrode below the a-Si:H film. The process is driven by a constant current of -50 pA to -500 pA while controlling the amount of transferred energy (1–300 nJ) as a function of time. Passing current leads to a formation of nanoscale pits in the a-Si:H films. Depending on the energy amount and rate the pits exhibit lower or orders of magnitude higher conductivity as detected by current-sensing AFM. High conductivity is attributed to a local crystallization of the films. This is confirmed by micro-Raman spectroscopy.
  • Field-enhanced metal-induced solid phase crystallization (FE-MISPC) at room temperature is employed to create microscopic crystalline regions at predefined positions in hydrogen-rich amorphous silicon (a-Si:H) films. Electric field is applied locally using a sharp conductive tip in atomic force microscope (AFM) and nickel electrode below the a-Si:H film. The process is driven by a constant current of -50 pA to -500 pA while controlling the amount of transferred energy (1–300 nJ) as a function of time. Passing current leads to a formation of nanoscale pits in the a-Si:H films. Depending on the energy amount and rate the pits exhibit lower or orders of magnitude higher conductivity as detected by current-sensing AFM. High conductivity is attributed to a local crystallization of the films. This is confirmed by micro-Raman spectroscopy. (en)
  • Polem-stimulavaná krystalizace v pevné fázi při pokojové teplotě je použita pro vytvoření krystalických oblastí v amorfním křemíku s vysokým obsahem vodíku v předem definovaných pozicích. Elektrické pole bylo vyvoláno mezi hrotem mikroskopu atomárních sil a niklovou elektrodou pod vrstvou amorfního křemíku. Proces je řízen konstantním proudem mezi 50 až 500 pA a systému je dodána předem definovaná energie mezi 1 až 300 nJ. Průchod proudu vede k vytvoření důlku s nanometrovými rozměry, v jehož středu se vytváří krystalická oblast, což bylo prokázáno mapou vodivosti v AFM i mikroRamanovskou spektroskopií. (cs)
Title
  • Spatially localized current-induced crystallization of amorphous silicon films
  • Prostorově definovaná krystalizace vrstev amorfního křemíku indukovaná proudem (cs)
  • Spatially localized current-induced crystallization of amorphous silicon films (en)
skos:prefLabel
  • Spatially localized current-induced crystallization of amorphous silicon films
  • Prostorově definovaná krystalizace vrstev amorfního křemíku indukovaná proudem (cs)
  • Spatially localized current-induced crystallization of amorphous silicon films (en)
skos:notation
  • RIV/68378271:_____/08:00320315!RIV09-AV0-68378271
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(KAN400100701), P(LC06040), P(LC510), Z(AV0Z10100521)
http://linked.open...iv/cisloPeriodika
  • 19-25
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 396301
http://linked.open...ai/riv/idVysledku
  • RIV/68378271:_____/08:00320315
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • silicon; crystallization; atomic force and scanning tunneling microscopy; nanocrystals (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [677EF247FE17]
http://linked.open...i/riv/nazevZdroje
  • Journal of Non-Crystalline Solids
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 354
http://linked.open...iv/tvurceVysledku
  • Rezek, Bohuslav
  • Ledinský, Martin
  • Fejfar, Antonín
  • Stuchlík, Jiří
  • Kočka, Jan
  • Šípek, Emil
  • Krejza, P.
http://linked.open...ain/vavai/riv/wos
  • 000256500400053
http://linked.open...n/vavai/riv/zamer
issn
  • 0022-3093
number of pages
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