About: Effect of structural imperfections on the characteristicas of YSZ dielectric layers grown by E-beam evaporation from the crystalline targets

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About: Effect of structural imperfections on the characteristicas of YSZ dielectric layers grown by E-beam evaporation from the crystalline targets Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Studované vrystvy byly připraveny napařováním pomocí elektronového svazku (cs) The films under study were deposited vy e-beam evaporation of yttria-stabilized zirconia (YSZ) The films under study were deposited vy e-beam evaporation of yttria-stabilized zirconia (YSZ) (en)
Title	Effect of structural imperfections on the characteristicas of YSZ dielectric layers grown by E-beam evaporation from the crystalline targets Effect of structural imperfections on the characteristicas of YSZ dielectric layers grown by E-beam evaporation from the crystalline targets (en) Vliv strukturních poruch na vlastnosti YSZ dielektrických vrstev, připravených vypařováním krystalu pomocí elektronového svazku (cs)
skos:prefLabel	Effect of structural imperfections on the characteristicas of YSZ dielectric layers grown by E-beam evaporation from the crystalline targets Effect of structural imperfections on the characteristicas of YSZ dielectric layers grown by E-beam evaporation from the crystalline targets (en) Vliv strukturních poruch na vlastnosti YSZ dielektrických vrstev, připravených vypařováním krystalu pomocí elektronového svazku (cs)
skos:notation	RIV/68378271:_____/05:00030688!RIV06-AV0-68378271
http://linked.open.../vavai/riv/strany	247;259
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(AV0Z10100521)
http://linked.open...iv/cisloPeriodika	3
http://linked.open...vai/riv/dodaniDat	2006
http://linked.open...aciTvurceVysledku	Zemek, Josef
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	519449
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/05:00030688
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	yttria-stabilized zirconia; thermal barrier coatings; vacuum-deposited films; thin- films; ultra-microhardness; optical properties; vapor-deposition; silicon; conductivity; ceria (en)
http://linked.open.../riv/klicoveSlovo	conductivity optical properties silicon thermal barrier coatings ceria thin- films ultra-microhardness vacuum-deposited films vapor-deposition yttria-stabilized zirconia
http://linked.open...odStatuVydavatele	SK - Slovenská republika
http://linked.open...ontrolniKodProRIV	[5548C3C75EB7]
http://linked.open...i/riv/nazevZdroje	Acta Physica Slovaca
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	9 (xsd:int)
http://linked.open...UplatneniVysledku	2005
http://linked.open...v/svazekPeriodika	55
http://linked.open...iv/tvurceVysledku	Navrátil, K. Zemek, Josef Jergel, M. Navrátil, V. Hartmanová, M. Kundracik, F. Chromik, S. Gandarilla, F. C. Gmucová, K.
http://linked.open...n/vavai/riv/zamer	Physics and technology of nanostructures, surfaces and thin films
issn	0323-0465
number of pages	13 (xsd:int)
is http://linked.open...avai/riv/vysledek of	Effect of structural imperfections on the characteristicas of YSZ dielectric layers grown by E-beam evaporation from the crystalline targets

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