The influence of surface roughness on angle-resolved photoelectron intensities has been studied by means of a semiempirical method and experimentally.
The influence of surface roughness on angle-resolved photoelectron intensities has been studied by means of a semiempirical method and experimentally. (en)
Byl studován vliv drsnosti povrchu na úhlové rozlišení intensity fotoelektronů. (cs)