The present review will address briefly typical procedures of quantitative analysis commonly used in AES and XPS, electron elastic scattering effects, surface sensitivity of the EPES for determination of the inelastic mean free path values and their energy dependences.
The present review will address briefly typical procedures of quantitative analysis commonly used in AES and XPS, electron elastic scattering effects, surface sensitivity of the EPES for determination of the inelastic mean free path values and their energy dependences. (en)