About: Investigation of Short-term Amplitude and Frequency Fluctuations of Lasers for Interferometry

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	One of the limiting factors of accuracy and resolution in laser interferometry is represented by noise properties of the laser powering the interferometer. Amplitude and especially frequency fluctuations of the laser source are crucial in precision distance measurement. Sufficiently high long-term frequency stability of the laser source must be achieved especially in applications in fundamental metrology. Furthermore, the short-term frequency variations are also important primarily for measurements done at high acquisition speeds. This contribution presents practical results of measurements of short-term amplitude and frequency noises of a set of laser sources commonly used in laser interferometry. The influence of the interferometer design and electrical parameters of the detection system are also discussed. One of the limiting factors of accuracy and resolution in laser interferometry is represented by noise properties of the laser powering the interferometer. Amplitude and especially frequency fluctuations of the laser source are crucial in precision distance measurement. Sufficiently high long-term frequency stability of the laser source must be achieved especially in applications in fundamental metrology. Furthermore, the short-term frequency variations are also important primarily for measurements done at high acquisition speeds. This contribution presents practical results of measurements of short-term amplitude and frequency noises of a set of laser sources commonly used in laser interferometry. The influence of the interferometer design and electrical parameters of the detection system are also discussed. (en)
Title	Investigation of Short-term Amplitude and Frequency Fluctuations of Lasers for Interferometry Investigation of Short-term Amplitude and Frequency Fluctuations of Lasers for Interferometry (en)
skos:prefLabel	Investigation of Short-term Amplitude and Frequency Fluctuations of Lasers for Interferometry Investigation of Short-term Amplitude and Frequency Fluctuations of Lasers for Interferometry (en)
skos:notation	RIV/68081731:_____/13:00397701!RIV14-TA0-68081731
http://linked.open...avai/predkladatel	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(ED0017/01/01), P(EE2.4.31.0016), P(GA102/09/1276), P(GPP102/11/P820), P(KAN311610701), P(LC06007), P(TA02010711)
http://linked.open...iv/cisloPeriodika	2
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Hrabina, Jan Číp, Ondřej Lazar, Josef Holá, Miroslava
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	81116
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/13:00397701
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	nanometrology; laser noise; AFM; spectroscopy; interferometry (en)
http://linked.open.../riv/klicoveSlovo	spectroscopy AFM interferometry nanometrology laser noise
http://linked.open...odStatuVydavatele	SK - Slovenská republika
http://linked.open...ontrolniKodProRIV	[83C0B96F493A]
http://linked.open...i/riv/nazevZdroje	Measurement Science Review
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	APPLICATION LABORATORIES OF ADVANCED MICROTECHNOLOGIES AND NANOTECHNOLOGIES Nanometrology using methods of scanning probe microscopy Centre of Modern Optics Interferometer with full in-line compensation of the fluctuations of refractive index Interferometric measurement techniques for nanopositioning Advanced interferometric systems for measurement in nanotechnology MEDTECH - educational and research partner network in medicine, biomedicine and scientific instruments
http://linked.open...UplatneniVysledku	2013
http://linked.open...v/svazekPeriodika	13
http://linked.open...iv/tvurceVysledku	Hrabina, Jan Lazar, Josef Číp, Ondřej Holá, Miroslava
http://linked.open...ain/vavai/riv/wos	000318150800003
issn	1335-8871
number of pages	7 (xsd:int)
http://bibframe.org/vocab/doi	10.2478/msr-2013-0014

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