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  • Annular dark-field scanning transmission electron microscopy (ADF STEM) at lower electron energies recently became important for direct imaging of samples consisting of elements with lower atomic numbers without the need of any additional contrast enhancement like staining by heavy atoms. Furthermore, the ADF STEM offers the opportunity for quantitative studies such as mass measurements of organic (biological and non-bilological) and inorganic specimens at the nanoscale. Here, we present the hardware and software extensions of a commercial high resolution scanning electron microscope (SEM) for the above manitoned applications.
  • Annular dark-field scanning transmission electron microscopy (ADF STEM) at lower electron energies recently became important for direct imaging of samples consisting of elements with lower atomic numbers without the need of any additional contrast enhancement like staining by heavy atoms. Furthermore, the ADF STEM offers the opportunity for quantitative studies such as mass measurements of organic (biological and non-bilological) and inorganic specimens at the nanoscale. Here, we present the hardware and software extensions of a commercial high resolution scanning electron microscope (SEM) for the above manitoned applications. (en)
Title
  • Mass measurements using electron scattering employing an %22in-lens%22 scanning electron microscope
  • Mass measurements using electron scattering employing an %22in-lens%22 scanning electron microscope (en)
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  • Mass measurements using electron scattering employing an %22in-lens%22 scanning electron microscope
  • Mass measurements using electron scattering employing an %22in-lens%22 scanning electron microscope (en)
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  • RIV/68081731:_____/12:00387268!RIV13-AV0-68081731
http://linked.open...avai/predkladatel
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • I, P(EE.2.3.20.0103)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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http://linked.open...dnocenehoVysledku
  • 148576
http://linked.open...ai/riv/idVysledku
  • RIV/68081731:_____/12:00387268
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • STEM; ADF; cryo-EM (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [C2160FF7588B]
http://linked.open...v/mistoKonaniAkce
  • Manchester
http://linked.open...i/riv/mistoVydani
  • Manchester
http://linked.open...i/riv/nazevZdroje
  • EMC 2012. Proceedings of the 15th European Microscopy Congress
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
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http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Krzyžánek, Vladislav
  • Tacke, S.
  • Reichelt, R.
  • Schönhoff, M.
  • Sporenberg, N.
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
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  • The Royal Microscopical Society
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  • 978-0-9502463-6-9
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