About: Scintillation secondary electron detector for ESEM and SEM

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In environmental scanning electron microscopes (ESEMs) specimens can be observed not only at vacuum conditions, but also at the pressure up to thousands of Pascals of different gases in the specimen chamber. It makes possible the direct observation of wet specimens, nonconductive specimens and phenomena on phase interfaces. Detection of signal electrons at the vacuum in the specimen chamber of the scanning electron microscope (SEM) is often based on the Everhart-Thornley scintillation detector. Detection of low energy secondary electrons (SEs) by this detector requires adding voltage up to 10 kV to a thin conductive layer on the scintillator and creating an electric field in front of the scintillator. Secondary electrons emitted from the sample surface are accelerated in this electric field and receive sufficient energy to evoke scintillations in the scintillator. This method of the detection of secondary electrons cannot be used at a higher pressure of gases in the specimen chamber of the ESEM because of problems with electric discharges in the gas environment. In environmental scanning electron microscopes (ESEMs) specimens can be observed not only at vacuum conditions, but also at the pressure up to thousands of Pascals of different gases in the specimen chamber. It makes possible the direct observation of wet specimens, nonconductive specimens and phenomena on phase interfaces. Detection of signal electrons at the vacuum in the specimen chamber of the scanning electron microscope (SEM) is often based on the Everhart-Thornley scintillation detector. Detection of low energy secondary electrons (SEs) by this detector requires adding voltage up to 10 kV to a thin conductive layer on the scintillator and creating an electric field in front of the scintillator. Secondary electrons emitted from the sample surface are accelerated in this electric field and receive sufficient energy to evoke scintillations in the scintillator. This method of the detection of secondary electrons cannot be used at a higher pressure of gases in the specimen chamber of the ESEM because of problems with electric discharges in the gas environment. (en)
Title	Scintillation secondary electron detector for ESEM and SEM Scintillation secondary electron detector for ESEM and SEM (en)
skos:prefLabel	Scintillation secondary electron detector for ESEM and SEM Scintillation secondary electron detector for ESEM and SEM (en)
skos:notation	RIV/68081731:_____/12:00383890!RIV13-GA0-68081731
http://linked.open...avai/predkladatel	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...avai/riv/aktivita	I P S
http://linked.open...avai/riv/aktivity	I, P(EE.2.3.20.0103), P(GAP102/10/1410), S
http://linked.open...iv/cisloPeriodika	Suppl. 2
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Jirák, Josef Neděla, Vilém
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	166880
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/12:00383890
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	environmental scanning electron microscopes; scintillation detector; secondary electrons (en)
http://linked.open.../riv/klicoveSlovo	scintillation detector secondary electrons environmental scanning electron microscopes
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[245A0049E847]
http://linked.open...i/riv/nazevZdroje	Microscopy and Microanalysis
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Support for human resources and transfer of knowledge in conditions of international cooperation of research teams The study of the influence of magnetic and electric fields for amplification of secondary electron signals detected by a novel detector in VP-SEM.
http://linked.open...UplatneniVysledku	2012
http://linked.open...v/svazekPeriodika	18
http://linked.open...iv/tvurceVysledku	Jirák, Josef Neděla, Vilém Čudek, P.
issn	1431-9276
number of pages	2 (xsd:int)
http://bibframe.org/vocab/doi	10.1017/S1431927612008185
is http://linked.open...avai/riv/vysledek of	Scintillation secondary electron detector for ESEM and SEM

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