About: Laser interference nano-comparator for length sensor calibration in nanometric scale

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In the work we present new laser measuring system for precise calibrations of length measuring transducers. This gauge is called nano-comparator because the resolution of the positioning of the measuring probe is in order of nanometers. The gauge works fully self-controlled and it is equipped by control software which is able to calibrate wide area of transducers. We put main stress to compensating of thermal dilatation of the gauge body and to eliminating of imperfection of linear guide ways which are used for positioning of the testing probe of the gauge. The work presents the first records of scale calibration of an incremental transducer. In the work we present new laser measuring system for precise calibrations of length measuring transducers. This gauge is called nano-comparator because the resolution of the positioning of the measuring probe is in order of nanometers. The gauge works fully self-controlled and it is equipped by control software which is able to calibrate wide area of transducers. We put main stress to compensating of thermal dilatation of the gauge body and to eliminating of imperfection of linear guide ways which are used for positioning of the testing probe of the gauge. The work presents the first records of scale calibration of an incremental transducer. (en)
Title	Laser interference nano-comparator for length sensor calibration in nanometric scale Laser interference nano-comparator for length sensor calibration in nanometric scale (en)
skos:prefLabel	Laser interference nano-comparator for length sensor calibration in nanometric scale Laser interference nano-comparator for length sensor calibration in nanometric scale (en)
skos:notation	RIV/68081731:_____/10:00352200!RIV11-GA0-68081731
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(FR-TI1/241), P(GA102/09/1276), P(GAP102/10/1813), P(KAN311610701), P(LC06007), Z(AV0Z20650511)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Buchta, Zdeněk Čížek, Martin Číp, Ondřej Lazar, Josef Šmíd, Radek Mikel, Břetislav
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	267939
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/10:00352200
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	nanoscale; precise measurement; laser; interferometer (en)
http://linked.open.../riv/klicoveSlovo	laser precise measurement nanoscale interferometer
http://linked.open...ontrolniKodProRIV	[FEFCE6679562]
http://linked.open...v/mistoKonaniAkce	Olomouc
http://linked.open...i/riv/mistoVydani	Ostrava
http://linked.open...i/riv/nazevZdroje	2nd International Conference NANOCON 2010
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	6 (xsd:int)
http://linked.open...cetTvurcuVysledku	6 (xsd:int)
http://linked.open...vavai/riv/projekt	Components for nano-diagnostic of length fluctuations, deviation of shapes and surface faults Methods for generation of a length etalon by means of stabilized femtosecond mode-locked laser Nanometrology using methods of scanning probe microscopy Centre of Modern Optics Interferometer with full in-line compensation of the fluctuations of refractive index
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Buchta, Zdeněk Lazar, Josef Číp, Ondřej Čížek, Martin Mikel, Břetislav Šmíd, Radek
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open...ain/vavai/riv/wos	000286656400046
http://linked.open.../riv/zahajeniAkce	2010-10-12 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Research into experimental methods for examination of the physical properties of matter and their application in advanced technologies
number of pages	4 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Tanger s.r.o.
https://schema.org/isbn	978-80-87294-19-2
is http://linked.open...avai/riv/vysledek of	Laser interference nano-comparator for length sensor calibration in nanometric scale

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