About: Optical and scanning electron microscopies in examination of ultrathin foils

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Very low energy scanning transmission electron microscopy is emerging as a novel tool for examination of ultrathin foils to learn more about the electron structure of solids. The electron micrographs provide image contrasts governed by the effective thickness of the sample proportional to the inner potential and at lowest energies the local density of electron states in the direction of impact of the electron wave starts to dominate. The optical methods are used during the sample preparation. The laser confocal microscope Olympus Lext OLS 3100 was used for preliminary observations of the 3 nm C foil prepared by magnetron sputtering in nitrogen atmosphere on a flat glass covered by a disaccharide layer. Very low energy scanning transmission electron microscopy is emerging as a novel tool for examination of ultrathin foils to learn more about the electron structure of solids. The electron micrographs provide image contrasts governed by the effective thickness of the sample proportional to the inner potential and at lowest energies the local density of electron states in the direction of impact of the electron wave starts to dominate. The optical methods are used during the sample preparation. The laser confocal microscope Olympus Lext OLS 3100 was used for preliminary observations of the 3 nm C foil prepared by magnetron sputtering in nitrogen atmosphere on a flat glass covered by a disaccharide layer. (en)
Title	Optical and scanning electron microscopies in examination of ultrathin foils Optical and scanning electron microscopies in examination of ultrathin foils (en)
skos:prefLabel	Optical and scanning electron microscopies in examination of ultrathin foils Optical and scanning electron microscopies in examination of ultrathin foils (en)
skos:notation	RIV/68081731:_____/10:00350660!RIV11-AV0-68081731
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(IAA100650902), Z(AV0Z20650511)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Hovorka, Miloš Müllerová, Ilona Konvalina, Ivo Fořt, Tomáš
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	277142
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/10:00350660
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	very low energy scanning transmission electron microscopy; ultrathin foils; laser confocal microscope (en)
http://linked.open.../riv/klicoveSlovo	laser confocal microscope ultrathin foils very low energy scanning transmission electron microscopy
http://linked.open...ontrolniKodProRIV	[4721D0ED06CE]
http://linked.open...v/mistoKonaniAkce	Skalský dvůr
http://linked.open...i/riv/mistoVydani	Brno
http://linked.open...i/riv/nazevZdroje	Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	Scanning transmission electron microscopy with very slow electrons
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Fořt, Tomáš Konvalina, Ivo Hovorka, Miloš Müllerová, Ilona
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2010-05-31 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Research into experimental methods for examination of the physical properties of matter and their application in advanced technologies
number of pages	2 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Institute of Scientific Instruments AS CR, v.v.i
https://schema.org/isbn	978-80-254-6842-5
is http://linked.open...avai/riv/vysledek of	Optical and scanning electron microscopies in examination of ultrathin foils Optical and scanning electron microscopies in examination of ultrathin foils Optical and scanning electron microscopies in examination of ultrathin foils

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