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Description
| - In materials science and semiconductor engineering, cathodoluminescence (CL) is a very efficient tool for the study of electronic substance structure and application possibilities. In spite of this, CL is only very rarely used for investigation of polymers. Recently Wellman et al introduced CL as an important tool for the investigation of materials for organic electroluminescence devices. It is evident that CL may become a strong tool for the investigation of polymer light emission possibilities as well as for investigation of triplet harvester organic solar cells. Our interest has been focused on the group of polysilanes (often also called polysilylanes), especially on poly[methyl(phenyl)silane] (PMPSi), having linear backbone of linked silicon atoms. Cathodoluminescence study of electron beam formed defects in PMPSi is presented in this paper.
- In materials science and semiconductor engineering, cathodoluminescence (CL) is a very efficient tool for the study of electronic substance structure and application possibilities. In spite of this, CL is only very rarely used for investigation of polymers. Recently Wellman et al introduced CL as an important tool for the investigation of materials for organic electroluminescence devices. It is evident that CL may become a strong tool for the investigation of polymer light emission possibilities as well as for investigation of triplet harvester organic solar cells. Our interest has been focused on the group of polysilanes (often also called polysilylanes), especially on poly[methyl(phenyl)silane] (PMPSi), having linear backbone of linked silicon atoms. Cathodoluminescence study of electron beam formed defects in PMPSi is presented in this paper. (en)
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Title
| - Cathodoluminescence study of electron beam formed defects in polysilanes
- Cathodoluminescence study of electron beam formed defects in polysilanes (en)
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skos:prefLabel
| - Cathodoluminescence study of electron beam formed defects in polysilanes
- Cathodoluminescence study of electron beam formed defects in polysilanes (en)
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skos:notation
| - RIV/68081731:_____/09:00335270!RIV10-AV0-68081731
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(IAA100100622), Z(AV0Z20650511), Z(AV0Z40500505)
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68081731:_____/09:00335270
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - cathodoluminescence; electron beam degradation; poly[methyl(phenyl)silane]; PMPSi; silicon polymers (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...ontrolniKodProRIV
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http://linked.open...v/mistoKonaniAkce
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http://linked.open...i/riv/mistoVydani
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http://linked.open...i/riv/nazevZdroje
| - MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
| - Kuřitka, I.
- Nešpůrek, Stanislav
- Schauer, Petr
- Schauer, P.
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http://linked.open...vavai/riv/typAkce
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http://linked.open.../riv/zahajeniAkce
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http://linked.open...n/vavai/riv/zamer
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number of pages
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http://purl.org/ne...btex#hasPublisher
| - Verlag der Technischen Universität
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https://schema.org/isbn
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is http://linked.open...avai/riv/vysledek
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