| Attributes | Values |
|---|
| rdf:type
| |
| Description
| - Rastrovací elektronový mikroskop (REM) s katodovou čočkou dovoluje zobrazit vzorek v celém rozsahu energií elektronů s téměř neměnným rozlišením obrazu. V oblasti velmi nízkých energií (jednotky až stovky eV), které nejsou k dispozici v klasickém REM (jednotky až desítky keV), je pozorována řada nových kontrastů, na jejichž tvorbě se účastní lokální chemická, krystalická i elektronická struktura vzorku. Interpretace je proto mnohdy nejednoznačná. Důležitou alternatvou je kombinace s vhodnou komplementární technikou, zejména s rastrovací mikroskopií Augerovými elektrony pro zjištění lokálního prvkového složení do hloubky podobné dosahu REM s pomalými elektrony. V rámci projektu bude dokončena ultravysokovakuová aparatura s autoemisním zdrojem elektronů, která umožní srovnání obou metod s prostorovým rozlišením v řádu nm (cs)
- The scanning electron microscope (SEM) equipped with the cathode lens enables one to image the specimen within full scale of electron energies with nearly unchanged image resolution. In the very low energy range (units to hundreds of eV), not available in classical SEM (units to tens of keV), new contrasts appear that reflect local chemical, crystallinic and electronic properties of the specimen. Interpretation of the image is hence often ambiguous. Important alternative is combination with a complementary technique, particularly with the scanning Auger electron microscopy revealing the elemental composition within the information depth similar to that of the low energy SEM. In the frame of this project an ultrahigh vacuum (UHV) apparatus with the fieldemission electron gun is being completed with both methods implemented at the image resolution in the nm range
- The scanning electron microscope (SEM) equipped with the cathode lens enables one to image the specimen within full scale of electron energies with nearly unchanged image resolution. In the very low energy range (units to hundreds of eV), not available in classical SEM (units to tens of keV), new contrasts appear that reflect local chemical, crystallinic and electronic properties of the specimen. Interpretation of the image is hence often ambiguous. Important alternative is combination with a complementary technique, particularly with the scanning Auger electron microscopy revealing the elemental composition within the information depth similar to that of the low energy SEM. In the frame of this project an ultrahigh vacuum (UHV) apparatus with the fieldemission electron gun is being completed with both methods implemented at the image resolution in the nm range (en)
|
| Title
| - Studium nanostruktur elektronovým svazkem (cs)
- Examination Of Nanostructures By Electron Beam
- Examination Of Nanostructures By Electron Beam (en)
|
| skos:prefLabel
| - Studium nanostruktur elektronovým svazkem (cs)
- Examination Of Nanostructures By Electron Beam
- Examination Of Nanostructures By Electron Beam (en)
|
| skos:notation
| - RIV/68081731:_____/04:00109098!RIV/2005/AV0/A12005/N
|
| http://linked.open.../vavai/riv/strany
| |
| http://linked.open...avai/riv/aktivita
| |
| http://linked.open...avai/riv/aktivity
| |
| http://linked.open...vai/riv/dodaniDat
| |
| http://linked.open...aciTvurceVysledku
| |
| http://linked.open.../riv/druhVysledku
| |
| http://linked.open...iv/duvernostUdaju
| |
| http://linked.open...titaPredkladatele
| |
| http://linked.open...dnocenehoVysledku
| |
| http://linked.open...ai/riv/idVysledku
| - RIV/68081731:_____/04:00109098
|
| http://linked.open...riv/jazykVysledku
| |
| http://linked.open.../riv/klicovaSlova
| - scanning electron microscope;scanning Auger electron microscopy;very slow electrons (en)
|
| http://linked.open.../riv/klicoveSlovo
| |
| http://linked.open...ontrolniKodProRIV
| |
| http://linked.open...v/mistoKonaniAkce
| |
| http://linked.open...i/riv/mistoVydani
| |
| http://linked.open...i/riv/nazevZdroje
| - EMAS 2004 - 6th Regional Workshop on Electron Probe Analysis Today - Practical Aspects
|
| http://linked.open...in/vavai/riv/obor
| |
| http://linked.open...ichTvurcuVysledku
| |
| http://linked.open...cetTvurcuVysledku
| |
| http://linked.open...vavai/riv/projekt
| |
| http://linked.open...UplatneniVysledku
| |
| http://linked.open...iv/tvurceVysledku
| - Müllerová, Ilona
- Hrnčiřík, Petr
|
| http://linked.open...vavai/riv/typAkce
| |
| http://linked.open.../riv/zahajeniAkce
| |
| number of pages
| |
| http://purl.org/ne...btex#hasPublisher
| - European Microbeam Analysis Society
|
![[RDF Data]](/fct/images/sw-rdf-blue.png)
![[cxml]](/fct/images/cxml_doc.png)
![[csv]](/fct/images/csv_doc.png)
![[text]](/fct/images/ntriples_doc.png)
![[turtle]](/fct/images/n3turtle_doc.png)
![[ld+json]](/fct/images/jsonld_doc.png)
![[rdf+json]](/fct/images/json_doc.png)
![[rdf+xml]](/fct/images/xml_doc.png)
![[atom+xml]](/fct/images/atom_doc.png)
![[html]](/fct/images/html_doc.png)