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Description
  • Představujeme experimentální výsledky dosažené naší metodou přímé transformace relativních změn délky měřicího ramene Michelsonova interferometru na relativní změny optické rezonanční frekvence Fabry-Perotova rezonátoru. Díky vysoce přesnému určení změny optické frekvence pomocí laserového standardu optických frekvencí jsme nyní schopni měřit tyto změny vzdáleností se subnanometrovým rozlišením. Tuto metodu jsme vyvinuli především pro ověření linearity našeho vysoce přesného Michelsonova interferometru, jehož rozlišení je 0,3 nm (cs)
  • We present experimental results achieved by a method of direct conversion of the relative changes of the measurement optical path of Michelson interferometer to relative changes of the resonant optical-frequency of Fabry-Perot (F.-P.) resonator. Thanks to ultra-precise determination of the optical frequency changes by means of laser frequency standard we are able to measure distance changes with sub-nanometer resolution. We developed this method for verification of scale-linearity of Michelson interferometer with total resolution 0.3 nm
  • We present experimental results achieved by a method of direct conversion of the relative changes of the measurement optical path of Michelson interferometer to relative changes of the resonant optical-frequency of Fabry-Perot (F.-P.) resonator. Thanks to ultra-precise determination of the optical frequency changes by means of laser frequency standard we are able to measure distance changes with sub-nanometer resolution. We developed this method for verification of scale-linearity of Michelson interferometer with total resolution 0.3 nm (en)
Title
  • Ultra-precise distance measurement for nanometrology
  • Ultra-precise distance measurement for nanometrology (en)
  • Vysoce přesná měření pro nanometrologii délek (cs)
skos:prefLabel
  • Ultra-precise distance measurement for nanometrology
  • Ultra-precise distance measurement for nanometrology (en)
  • Vysoce přesná měření pro nanometrologii délek (cs)
skos:notation
  • RIV/68081731:_____/04:00109089!RIV/2005/AV0/A12005/N
http://linked.open.../vavai/riv/strany
  • 22;25
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(IAA2065202)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 591319
http://linked.open...ai/riv/idVysledku
  • RIV/68081731:_____/04:00109089
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • high-resolution laser interferometry;tunable laser;scale linearity (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [9ADF98EEB702]
http://linked.open...v/mistoKonaniAkce
  • Strasbourg
http://linked.open...i/riv/mistoVydani
  • Strasbourg
http://linked.open...i/riv/nazevZdroje
  • Proceedings of SPIE - The International society for optical engineering. Optical Metrology in Production Engineering. (Vol. 5457)
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Lazar, Josef
  • Číp, Ondřej
  • Petrů, František
  • Buchta, Z.
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
http://purl.org/ne...btex#hasPublisher
  • SPIE
https://schema.org/isbn
  • 0-8194-5379-X
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