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Description
  • Ionizační detektor je používán pro detekci signálních elektronů v environmentálním rastrovacím elektronovém mikroskopu (ESEM). Detektor pracuje na principu zesílení signálních elektronů v procesu nárazové ionizace v plynném prostředí komory vzorku. Uzemněný vzorek vytváří jednu elektrodu paralelního elektrodového detekčního systému. Druhá elektroda je umístěna nad vzorkem a je připojena na vhodný potenciál k dodání ionizační energie sekundárním elektronům. Tato elektroda současně detekuje zesílené signální elektrony (cs)
  • An ionization detector is often used for the detection of signal electrons in environmental scanning electron microscope (ESEM). This detector is based on the principle of signal electron amplification by the process of impact ionization in the specimen chamber with a gaseous environment. The grounded specimen forms one electrode of the parallel electrode detection system. The second electrode is placed above the specimen, and it is connected to the appropriate potential that causes impact ionization of secondary electrons. A hole in the upper electrode allows primary electrons to pass to the specimen and this electrode also detects amplified signal electrons
  • An ionization detector is often used for the detection of signal electrons in environmental scanning electron microscope (ESEM). This detector is based on the principle of signal electron amplification by the process of impact ionization in the specimen chamber with a gaseous environment. The grounded specimen forms one electrode of the parallel electrode detection system. The second electrode is placed above the specimen, and it is connected to the appropriate potential that causes impact ionization of secondary electrons. A hole in the upper electrode allows primary electrons to pass to the specimen and this electrode also detects amplified signal electrons (en)
Title
  • Dependence of contrast on pressure using segmental ionization detector in environmental SEM
  • Závislost kontrastu na tlaku u segmentového ionizačního detektoru v ESEM (cs)
  • Dependence of contrast on pressure using segmental ionization detector in environmental SEM (en)
skos:prefLabel
  • Dependence of contrast on pressure using segmental ionization detector in environmental SEM
  • Závislost kontrastu na tlaku u segmentového ionizačního detektoru v ESEM (cs)
  • Dependence of contrast on pressure using segmental ionization detector in environmental SEM (en)
skos:notation
  • RIV/68081731:_____/04:00109025!RIV/2005/AV0/A12005/N
http://linked.open.../vavai/riv/strany
  • 341;342
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(IBS2065107)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 559734
http://linked.open...ai/riv/idVysledku
  • RIV/68081731:_____/04:00109025
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • ionization detector;ESEM (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [B1C10CE97BDA]
http://linked.open...v/mistoKonaniAkce
  • Antwerp
http://linked.open...i/riv/mistoVydani
  • Liege
http://linked.open...i/riv/nazevZdroje
  • EMC 2004 - Proceedings of the 13th European Microscopy Congress
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Autrata, Rudolf
  • Jirák, J.
  • Schauer, Petr
  • Schneider, L.
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
http://purl.org/ne...btex#hasPublisher
  • Belgian Society for Microscopy
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