About: Scanning low energy electron microscopy.

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Extensive review deals with principles of the scanning low energy electron microscopy in all important aspects starting from motivations to lower energy of electrons impinging on the specimen, including problems of interaction of slow electrons with the matter, emission yields, electron optical problems of formation low energy electron beams, detection issues, and general as well as specific questions of the instrumentation, and finishing with presentation of selected application results demonstrating capabilities of this microscopic mode. Extensive review deals with principles of the scanning low energy electron microscopy in all important aspects starting from motivations to lower energy of electrons impinging on the specimen, including problems of interaction of slow electrons with the matter, emission yields, electron optical problems of formation low energy electron beams, detection issues, and general as well as specific questions of the instrumentation, and finishing with presentation of selected application results demonstrating capabilities of this microscopic mode. (en)
Title	Scanning low energy electron microscopy. Scanning low energy electron microscopy. (en)
skos:prefLabel	Scanning low energy electron microscopy. Scanning low energy electron microscopy. (en)
skos:notation	RIV/68081731:_____/03:12030095!RIV/2004/AV0/A12004/N
http://linked.open.../vavai/riv/strany	309 ; 443
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(AV0Z2065902)
http://linked.open...vai/riv/dodaniDat	2004
http://linked.open...aciTvurceVysledku	Müllerová, Ilona Frank, Luděk
http://linked.open.../riv/druhVysledku	C - Kapitola v knize
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	626383
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/03:12030095
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	scanning electron microscope; low energy SEM; low energy electron beams (en)
http://linked.open.../riv/klicoveSlovo	scanning electron microscope low energy SEM low energy electron beams
http://linked.open...ontrolniKodProRIV	[1BEBC3379BAA]
http://linked.open...i/riv/mistoVydani	New York
http://linked.open...vEdiceCisloSvazku	(1)
http://linked.open...i/riv/nazevZdroje	Advances in imaging and electron physics Vol. 128.
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...UplatneniVysledku	2003
http://linked.open...iv/tvurceVysledku	Müllerová, Ilona Frank, Luděk
http://linked.open...n/vavai/riv/zamer	Rozvoj fyzikálních metod, speciálních technologií a přístrojových principů využívajících elektronových a světelných svazků a radiofrekvenční spektroskopie
number of pages	134 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Elsevier Science

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