About: Detection of backscattered electrons in environmental scanning electron microscope.     Goto   Sponge   NotDistinct   Permalink

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Description
  • Impact of primary electrons causes generation of signals in the environmental scanning electron microscope (ESEM). These signals can be subsequently detected. Secondary and backscattered electrons are very often used to obtain information about the specimen. In ESEM secondary electrons are mostly detected by a ionisation detector, while backscattered electrons are detected by a scintillation detector.
  • Impact of primary electrons causes generation of signals in the environmental scanning electron microscope (ESEM). These signals can be subsequently detected. Secondary and backscattered electrons are very often used to obtain information about the specimen. In ESEM secondary electrons are mostly detected by a ionisation detector, while backscattered electrons are detected by a scintillation detector. (en)
Title
  • Detection of backscattered electrons in environmental scanning electron microscope.
  • Detection of backscattered electrons in environmental scanning electron microscope. (en)
skos:prefLabel
  • Detection of backscattered electrons in environmental scanning electron microscope.
  • Detection of backscattered electrons in environmental scanning electron microscope. (en)
skos:notation
  • RIV/68081731:_____/03:12030032!RIV/2004/AV0/A12004/N
http://linked.open.../vavai/riv/strany
  • 489 ; 490
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  • P(GA102/01/1271), Z(AV0Z2065902)
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  • 603258
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  • RIV/68081731:_____/03:12030032
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  • collection angle; signal level; detector (en)
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  • [374354EF8AAD]
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  • Pula [HR]
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  • Zagreb
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  • Proceedings of the 6th Multinational Congress on Microscopy - European Extension.
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  • Autrata, Rudolf
  • Jirák, Josef
  • Wandrol, Petr
  • Špinka, Jiří
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  • Croatian Society for Electron Microscopy
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