About: Contrast Mechanisms in the Scanning Low Energy Electron Microscopy.

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The SEM instruments, marketed at the present time, cover the range of impact energies of primary electrons down to 1 keV. Systems with compound objective lenses, containing a retarding field element, extend this range down to about 200 eV and the cathode lens (CL) equipped devices allow using arbitrarily low impact energy at acceptable resolution [1]. Consequently, the electron energy becomes a mere parameter of the SEM image and all contrast mechanisms, excited by electron impact, appear as equally available. Similarly, the strict distinguishing between kinds of information mediated by seconary (SE) and backscattered (BSE) electrons, respectively, is less relevant with novel detector principles employing acceleration of emitted electrons and conversion of accelerated signal species to slow SE. A CL equipped SEM detects SE and BSE together so that both should be always considered with any particular family of contrasts. The SEM instruments, marketed at the present time, cover the range of impact energies of primary electrons down to 1 keV. Systems with compound objective lenses, containing a retarding field element, extend this range down to about 200 eV and the cathode lens (CL) equipped devices allow using arbitrarily low impact energy at acceptable resolution [1]. Consequently, the electron energy becomes a mere parameter of the SEM image and all contrast mechanisms, excited by electron impact, appear as equally available. Similarly, the strict distinguishing between kinds of information mediated by seconary (SE) and backscattered (BSE) electrons, respectively, is less relevant with novel detector principles employing acceleration of emitted electrons and conversion of accelerated signal species to slow SE. A CL equipped SEM detects SE and BSE together so that both should be always considered with any particular family of contrasts. (en)
Title	Contrast Mechanisms in the Scanning Low Energy Electron Microscopy. Contrast Mechanisms in the Scanning Low Energy Electron Microscopy. (en)
skos:prefLabel	Contrast Mechanisms in the Scanning Low Energy Electron Microscopy. Contrast Mechanisms in the Scanning Low Energy Electron Microscopy. (en)
skos:notation	RIV/68081731:_____/03:12030024!RIV/2004/AV0/A12004/N
http://linked.open.../vavai/riv/strany	120 ; 121
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(IAA1065304), P(IPP1050128), Z(AV0Z2065902)
http://linked.open...iv/cisloPeriodika	Sup. 3
http://linked.open...vai/riv/dodaniDat	2004
http://linked.open...aciTvurceVysledku	Müllerová, Ilona Frank, Luděk
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	602124
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/03:12030024
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	scanning electron microscope; primary electrons; cathode lens (en)
http://linked.open.../riv/klicoveSlovo	cathode lens primary electrons scanning electron microscope
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[262AD6C3398B]
http://linked.open...i/riv/nazevZdroje	Microscopy and Microanalysis
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...vavai/riv/projekt	Multichannel spectro-microscopy with slow and Auger electrons Dynamics of processes in living and inanimate matter
http://linked.open...UplatneniVysledku	2003
http://linked.open...v/svazekPeriodika	9
http://linked.open...iv/tvurceVysledku	Müllerová, Ilona Frank, Luděk
http://linked.open...n/vavai/riv/zamer	Rozvoj fyzikálních metod, speciálních technologií a přístrojových principů využívajících elektronových a světelných svazků a radiofrekvenční spektroskopie
issn	1431-9276
number of pages	2 (xsd:int)

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