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  • Problem of the low material contrast recorded by means of low energy (1 keV) backscattered electrons in SEM is described. Other advantages of low energy backscatterd electrons are discussed. A very efficient low voltage YAG-BSE detector has been developed and used for the imaging of the specimen surfaces with a high resolution.
  • Problem of the low material contrast recorded by means of low energy (1 keV) backscattered electrons in SEM is described. Other advantages of low energy backscatterd electrons are discussed. A very efficient low voltage YAG-BSE detector has been developed and used for the imaging of the specimen surfaces with a high resolution. (en)
Title
  • Detection of low energy backscattered electrons for the study of material contrast in SEM.
  • Detection of low energy backscattered electrons for the study of material contrast in SEM. (en)
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  • Detection of low energy backscattered electrons for the study of material contrast in SEM.
  • Detection of low energy backscattered electrons for the study of material contrast in SEM. (en)
skos:notation
  • RIV/68081731:_____/00:12000076!RIV/2003/AV0/A12003/N
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  • 17;18
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  • Z(AV0Z2065902)
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  • 708371
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  • RIV/68081731:_____/00:12000076
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  • N/A (en)
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  • [01F00675D5F7]
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  • Zakopane [PL]
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  • Krakow
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  • Proceedings of 3rd Japanese.Polish Joint Seminar on Material Analysis.
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  • Autrata, Rudolf
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  • Instytut Metalurgii i Inżynierii Materiałowej im. Aleksandra Krupkowskiego Polskiej Akademii Nauk
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