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Description
  • One of the recent directions in the field of scanning electron microscopy deals with observation of specimens at higher pressures in the specimen chamber. Owing to the presence of the gaseous medium, charging effects are suppressed for specimens of insulation character, and at the same time the observation of biological specimens without their prior treatment is made possible. The constructed combined scintillation and ionisation detector extends the applications of these microscopes and enables copmarison of behaviour and properties of both detectors.
  • One of the recent directions in the field of scanning electron microscopy deals with observation of specimens at higher pressures in the specimen chamber. Owing to the presence of the gaseous medium, charging effects are suppressed for specimens of insulation character, and at the same time the observation of biological specimens without their prior treatment is made possible. The constructed combined scintillation and ionisation detector extends the applications of these microscopes and enables copmarison of behaviour and properties of both detectors. (en)
Title
  • Combined scintillation and ionisation detectors for environmental scanning electron microscopes.
  • Combined scintillation and ionisation detectors for environmental scanning electron microscopes. (en)
skos:prefLabel
  • Combined scintillation and ionisation detectors for environmental scanning electron microscopes.
  • Combined scintillation and ionisation detectors for environmental scanning electron microscopes. (en)
skos:notation
  • RIV/68081731:_____/00:12000025!RIV/2003/AV0/A12003/N
http://linked.open.../vavai/riv/strany
  • I241;I242
http://linked.open...avai/riv/aktivita
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  • P(GA102/00/0969), Z(AV0Z2065902)
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  • 707109
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  • RIV/68081731:_____/00:12000025
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  • N/A (en)
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  • [6DD95DD1C896]
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  • Brno [CZ]
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  • Brno
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  • Proceedings of the 12th European Congress on Electron Microscopy.
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  • Autrata, Rudolf
  • Romanovský, Vladimír
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http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
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  • Czechoslovak Society for Electron Microscopy
https://schema.org/isbn
  • 80-238-5503-4
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