About: X-ray scattering study of oxide precipitates in Cz-Si

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Two x-ray diffraction methods were used for characterization of the oxide precipitates in Czochralski silicon series of samples. The maping of the diffuse scattering around reciprocal lattice point in Bragg geometry and the simultaneous measurement of the diffracted and transmitted beam intensity in the Laue diffraction geometry. Two x-ray diffraction methods were used for characterization of the oxide precipitates in Czochralski silicon series of samples. The maping of the diffuse scattering around reciprocal lattice point in Bragg geometry and the simultaneous measurement of the diffracted and transmitted beam intensity in the Laue diffraction geometry. (en)
Title	X-ray scattering study of oxide precipitates in Cz-Si X-ray scattering study of oxide precipitates in Cz-Si (en)
skos:prefLabel	X-ray scattering study of oxide precipitates in Cz-Si X-ray scattering study of oxide precipitates in Cz-Si (en)
skos:notation	RIV/68081723:_____/10:00421391!RIV14-AV0-68081723
http://linked.open...avai/riv/aktivita	I
http://linked.open...avai/riv/aktivity	I
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Svoboda, Milan Buršík, Jiří
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav fyziky materiálů AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	299059
http://linked.open...ai/riv/idVysledku	RIV/68081723:_____/10:00421391
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	x-ray; silicon; defects (en)
http://linked.open.../riv/klicoveSlovo	defects silicon x-ray
http://linked.open...ontrolniKodProRIV	[783F817716F8]
http://linked.open...v/mistoKonaniAkce	Rožnov pod Radhoštěm
http://linked.open...i/riv/mistoVydani	Rožnov pod Radhoštěm
http://linked.open...i/riv/nazevZdroje	SILICON 2010. 12th Scientific and Business Conference
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	8 (xsd:int)
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Bernatová, S. Buršík, Jiří Svoboda, Milan Bernstorff, S. Mikulík, P. Caha, O. Meduňa, M. Růžička, J.
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2010-11-02 (xsd:date)
number of pages	2 (xsd:int)
http://purl.org/ne...btex#hasPublisher	TECON Scientific, s.r.o.
https://schema.org/isbn	978-80-254-7361-0

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