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Description
| - We report on recent progress with development of astronomical X-ray optics based on thermally formed glass foils and on bent Si wafers. Experiments with thermal glass forming have continued adding wider range of evaluated and optimized parameters. Recent efforts with Si wafers have been focused on their quality improvements such as flatness and thickness uniformity in order to better meet the requirements of future X-ray astronomy projects applications, as well as on study of their surface quality, defects analysis, and methods for its reproducible measurement.
- We report on recent progress with development of astronomical X-ray optics based on thermally formed glass foils and on bent Si wafers. Experiments with thermal glass forming have continued adding wider range of evaluated and optimized parameters. Recent efforts with Si wafers have been focused on their quality improvements such as flatness and thickness uniformity in order to better meet the requirements of future X-ray astronomy projects applications, as well as on study of their surface quality, defects analysis, and methods for its reproducible measurement. (en)
- V článku podáváme zprávu o pokroku s vývojem astronomické rentgenové optiky založené na tepelně utvořených skleněných foliích a na ohnutých Si deskách. Experimenty s tepelným zpracováním skla pokračovaly přidáním širší řady ohodnocených a optimalizovaných parametrů. Nové úsilí se Si deskami bylo zaměřené na zlepšování jakosti, aby lépe uspokojily požadavky budoucích rentgenových projektů a aplikací, stejně jako na studium jejich jakosti povrchu, analýzy defektů, a metod na měření. Také diskutujeme první výsledky ozařovacích zkoušek vybraných substrátů. (cs)
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Title
| - Recent progress with x-ray optics based on Si wafers and glass foils
- Novodobý pokrok s rentgenovou optikou založenou na Si deskách a skleněných foliích (cs)
- Recent progress with x-ray optics based on Si wafers and glass foils (en)
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skos:prefLabel
| - Recent progress with x-ray optics based on Si wafers and glass foils
- Novodobý pokrok s rentgenovou optikou založenou na Si deskách a skleněných foliích (cs)
- Recent progress with x-ray optics based on Si wafers and glass foils (en)
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skos:notation
| - RIV/67985815:_____/08:00321637!RIV09-AV0-67985815
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(IAAX01220701), P(ME 918), Z(AV0Z10030501)
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/67985815:_____/08:00321637
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - X-ray optics; Si wafers; glass foils (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...ontrolniKodProRIV
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http://linked.open...v/mistoKonaniAkce
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http://linked.open...i/riv/mistoVydani
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http://linked.open...i/riv/nazevZdroje
| - Recent progress with x-ray optics based on Si wafers and glass foils
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
| - Hudec, René
- Pína, L.
- Inneman, A.
- Míka, M.
- Skulinová, Michaela
- Lorenz, M.
- Švéda, L.
- Semencová, V.
- Sik, J.
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http://linked.open...vavai/riv/typAkce
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http://linked.open...ain/vavai/riv/wos
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http://linked.open.../riv/zahajeniAkce
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http://linked.open...n/vavai/riv/zamer
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issn
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number of pages
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http://purl.org/ne...btex#hasPublisher
| - International Society for Optical Engineering
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is http://linked.open...avai/riv/vysledek
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