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  • In the paper an approach for at-speed board-level interconnection faults diagnosis of Combo6 card is presented. Existing methods and their limitations are briefly discussed first. Then, one-step diagnosis method for diagnosis of Combo6 wiring interconnects is presented. The method is based on utilization of Universal Test Set. Hardware architecture of designed test generator and response evaluation implemented in software is described. The method allows to identify static faults (with fault type determination) and detection of dynamic faults.
  • In the paper an approach for at-speed board-level interconnection faults diagnosis of Combo6 card is presented. Existing methods and their limitations are briefly discussed first. Then, one-step diagnosis method for diagnosis of Combo6 wiring interconnects is presented. The method is based on utilization of Universal Test Set. Hardware architecture of designed test generator and response evaluation implemented in software is described. The method allows to identify static faults (with fault type determination) and detection of dynamic faults. (en)
  • V článku je představena metodika at-speed testování spojů na kartě COMBO6. Nejprve jsou představeny existující metody testování spojů a jejich omezení. Poté je prezentována jednokroková metoda testování spojů použitá pro testování karty COMBO6. Navržená metoda je založena na využití metody Univeral Test Set. Práce se také zabývá hardwarovou architekturou generátoru testu a je popsáno softwarové vyhodnocení výsledků testu. Navržená metoda umožňuje identifikaci statických a detekci dynamických chyb. (cs)
Title
  • At-speed Wiring Interconnects Testing on COMBO6 Card
  • At-speed Wiring Interconnects Testing on COMBO6 Card (en)
  • At-speed testování spojů na kartě COMBO6 (cs)
skos:prefLabel
  • At-speed Wiring Interconnects Testing on COMBO6 Card
  • At-speed Wiring Interconnects Testing on COMBO6 Card (en)
  • At-speed testování spojů na kartě COMBO6 (cs)
skos:notation
  • RIV/63839172:_____/05:00000041!RIV09-MSM-63839172
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM6383917201)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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http://linked.open...iv/duvernostUdaju
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  • 513298
http://linked.open...ai/riv/idVysledku
  • RIV/63839172:_____/05:00000041
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  • at-speed testing; interconnection testing; COMBO6 (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [8284599CBCE8]
http://linked.open...v/mistoKonaniAkce
  • Sopron, Hungary
http://linked.open...i/riv/mistoVydani
  • Sopron, Hungary
http://linked.open...i/riv/nazevZdroje
  • Proc. of 8th IEEE Design and Diagnostic of Electronic Circuits and Systems Workshop
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  • Pečenka, Tomáš
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http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • Proc. of 8th IEEE Design and Diagnostic of Electronic Circuits and Systems Workshop
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  • 963-9364-48-7
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